Добавил:
Upload Опубликованный материал нарушает ваши авторские права? Сообщите нам.
Вуз: Предмет: Файл:

material1 / different / Chung-Yu Wu - Analog Circuit Design

.pdf
Скачиваний:
61
Добавлен:
05.06.2015
Размер:
29 Мб
Скачать
☆

13-25

CHUNG-YU WU

Table II Comparison of the proposed A/D converter with the previous ratio-independent A/D converters [4.4]-[4.5].

A/D converters

 

 

 

Performance

[4.4]

[4.5]

This work

 

 

 

 

 

 

 

Resolution

 

 

 

(bits)

12

8

14

 

 

 

 

 

 

 

Absolute

 

 

 

INL (LSB)

<= 1.5

<= 0.5

<= 1

 

 

 

 

 

 

 

OP amp dc

 

 

 

Gain (dB)

92

84

60

 

 

 

 

 

 

 

Clock cycles

 

 

 

for n bits

6n

3n

7n

 

 

 

 

 

 

 

Sampling rate

 

 

 

(KHz)

8

8

10

 

 

 

 

 

 

 

Power dissipation

 

 

 

(mW)

17

-

50

 

 

 

 

 

 

 

13-26

CHUNG-YU WU

§13-5 Full Flash (Parallel)

*Need 2N-1 comparators for N bits.

*Need 2N-1 Resister (R) tapes for N bits.

*S/H usually combined with comparators. (No op amp is required) ? Large no. of analog elements.

? Large chip area power consumption.

Full-flash A/D converter

VIN

VREF+

+

2N-1

-

+

2N-2

-

+

2

-

+

1

-

comparator

Clock generator

2N-1

2N-2

Encoder

2N-1 to N binary code

2

1

Latch

VREF-

Output registor & buffer

bN-1

bN-2 bN-3

b2 b1 b0

13-27

CHUNG-YU WU

§13-5.1 MOS Flash ADC's

Ref.: IEEE JSSC, vol. sc-14, pp. 926-932, Dec. 1979.

CMOS/SOS 6 bit 20 MHz ADC.

6-BIT BINARY OUTPUT

Block diagram of A/D converter chip.

High speed autozeroed CMOS/SOS comparator.

13-28

CHUNG-YU WU

Discrete and distributed reference ladder models

Ccomp £ 0.05 pF, RTAP = 20W

Z(w)

³50,000 (< 10,000, don't work)

R TAP

Reference ladder leading as a function of input voltage

(|Z|(W) /RTAP = 500)

Effect of loading ratio on reference ladder output.

13-29

CHUNG-YU WU

Major source of error is the loading of the reference resistor ladder by the

comparator bank.

Resistor ladder loading errors are of two types:

(1)"Transient error" associated with instantaneous ladder loading during a single measurement;

(2)Long-term "recovery error" associated with errors at a new input level after the ladder has been loaded for a long period by inputs at another level.

If the capacitor bypassing is performed at the externally accessable ladder

midpoint tap,

Þtransient impedance ¯ by a factor of more than 4.

ÞWorst-case static loading which can't be bypassed makes recovery errors

the significant error source.

* All the errors considered above are of this type.

Typical 6-bit A/D converter Performance:

 

Power dissipation at 15 MHz clock, 20 pF/output.

 

 

5V

8V

convert mode

50mW

145mW

Tracking mode

45mW

130mW

3.2V reference

9mW

9mW

Input Cap.

8 pF

8 pF

Recom. Vref

3.2V

6.4V

On-chip Zener Reference

3.2V

6.4V

Input voltage source resistance

75W

75W

Accuracy 15MHz

1 LSB

1 LSB

 

2

2

20MHz

---

1 LSB

25MHz

---

1.5 LSB

13-30

CHUNG-YU WU

§13-5.2 7-Bit CMOS Flash ADC for Video Applications

Ref.: IEEE J. Solid-State Circuits, vol. sc-21, pp. 436-440, June, 1986

Overall schematic:

 

 

 

 

D-Type

 

 

 

 

Output

VREF

 

Comparator

 

Latch

 

 

Overflow

TOP

 

 

 

R/2 Banks Latches

 

 

 

 

 

 

 

127

 

 

 

 

R

 

D6

 

 

 

 

D5

 

 

R

 

 

 

 

64

128 to

D4

 

 

R/2

7 bit

Mid

 

 

 

 

Encoder

 

Decouple

 

 

Logic

 

 

 

R/2

D3

 

Cext

 

 

 

 

 

Capacitor

 

R

 

D2

Bypassing

 

 

 

 

 

 

 

 

 

D1

 

 

R

 

 

 

 

0

 

 

VREF

 

R/2

 

D0

 

 

 

Bottom

 

 

 

 

Analog

 

 

 

 

Input

 

 

 

 

Clock Buffer

R:Polysilicon resistor, 10 Ω / bit 2μm Poly-gate VLSI CMOS Overall ship area: 135×142 mil2

13-31

CHUNG-YU WU

Comparator and the primary latch

+VDD

Load

OUTPUT

OUTPUT Bias

 

 

Q10

 

Q11

Q12

 

Q13

 

 

 

 

 

 

Q14

Q16

 

Q3

 

 

 

 

Vbias

 

 

 

Q4

Vbias

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Q5

Q6

 

Reference

Analog

 

 

 

Input

 

 

 

 

 

 

 

 

 

 

 

Input

Q1

 

 

 

 

Q2

 

 

 

 

 

 

 

Latch

Q8

Q9

Latch

 

 

 

 

I2Bias

 

IBias

 

 

 

I2Bias

 

 

Q7

 

 

 

 

 

 

 

Q15

 

 

 

 

 

 

 

 

 

 

-VSS

 

 

Gain: 18dB

Q10, Q13: Operated in linear region

Bandwidth: 40 MHz

with on-chip low-power

 

OP AMP and reference

 

loop.

 

 

 

 

Þ Ro¯, fu-.

 

 

Q5,Q6: Positive feedback to

Q11, Q12: To limit the output swing

form latch.

and

enable

the

 

comparator

to recover

 

much

faster

from

the

 

latched state.

 

The secondary latch is of the hysteresis type, because

 

 

 

(1)it can convert the limited logic swing of the primary latch to correct CMOS logic levels.

(2)it can reduce the amount of hysteresis to ~ 100mV by setting "Latch"

13-32

CHUNG-YU WU

signal to High. Thus the latch always experiences an overdrive of 100 mV.

ÞAvoid ambiguous state and increase the resolution time of the comparators.

ÞReduce metastability error probability

Performance characteristics:

 

7-bit inherently monotonic

 

Accuracy: differential and integral

± 0.5 LSB.

Analog bandwidth

: -3dB 42 MHz; - 1 LSB 5 MHz

 

2

Maximum sample rate

: > 22 MSPS, 30 MSPS typically

VDD

: 5V ± 0.5V

Input range

: 1.5V~3.5V

Power consumption (25MSPS)

: 350 mW

Temp. range

: - 40 o C to + 85 o C

§13-5.3 CMOS 20 MS/S (Maga Samples /sec) 7-bit Flash ADC

Ref.: ISSCC 84, PP. 56-57, 315.

Nonsampling amplifier:

 

φ1

S5

 

 

 

 

 

 

φ1

 

VDD

VDD

 

 

 

 

S1

CA

 

φA

 

 

 

 

S7

LATCH

S2

 

 

 

 

φ1

 

 

 

Sampling

 

 

 

 

Clock

 

φ2

S6

 

 

φ2

VDD

VDD

 

 

 

 

 

S3

 

 

φB

 

 

 

 

 

 

 

 

S8

 

S4

CB

 

 

 

 

 

 

 

φ2

 

 

 

 

* Higher operating. frequency

13-33

CHUNG-YU WU

§13-5.4 Metastability error

Ref.: IEEE JSSC, vol. 31, pp. 1132-1140, Aug. 1996, 7-b 80-MHz flash ADC

Metastability error: occurs in ADCs when undefined comparator outputs pass through the encoder to the converter output bits.

VA < V REFi+1

0

 

 

0

VA < VREFi+1

 

 

0

 

 

0

 

 

i+1

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0

i+1

0

 

 

 

 

Metastable

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1

i

i

X

 

 

VA

~

VREFi state

 

 

 

 

 

 

 

1

 

i-1

1

 

 

 

 

 

 

 

 

 

 

VA > V REF

1

 

 

1

VA > VREFi-1

Thermometer code with

Thermometer code with

valid comparator outputs

metastable comparator

*Metastability error rate is an exponential function of the sampling frequency.

*It is nearly independent of the input frequency.

*At 70-MHz sampling frequeny, the metastability error rate is ~ 10-7 errors/cycle.

Þ7 errors per second

*Can be improved to < 10-12 errors/cycle.

13-34

CHUNG-YU WU

§13-6 Two-Step Flash or Subranging ADC

Conventional two-step A/D converter:

 

 

 

 

 

+

VIN

SAMPLE

COARSE

 

-

FINE

&

FLASH

DAC

FLASH

 

 

 

HOLD

ADC

 

 

ADC

 

 

 

 

 

ANALOG

 

 

 

 

 

ADDITION

LATCH

DIGITAL

OUTPUT

Two-step A/D converter with single resister ladder:

 

Vin

 

 

VIN

MSB'S

 

 

 

 

 

 

 

TGS2

 

SAMPLE

TGS

SAMPLE

 

 

 

COARSE

TGC16

VREF

 

LSB'S

COMPARATOR

 

 

15

NO. 16

 

R16

 

 

COARSE

TGC15

 

 

 

 

 

COMPARATOR

 

 

15

 

NO. 15

 

 

 

COARSE

TGC14

R15

 

 

COMPARATOR

 

 

 

 

 

 

 

NO. 14

 

 

15

FC #15

 

 

 

 

 

 

 

"COARSE"

 

R14

 

FC #14

 

 

 

DECODER

 

 

 

 

/ENCODER

 

 

 

 

 

 

 

 

*FINE*

 

 

R3

15

DECODER

COARSE

TGC2

 

/ENCODER

 

 

 

 

 

 

COMPARATOR

 

 

 

 

NO. 2

 

R2

15

 

COARSE

TGC1

 

 

 

 

 

 

 

 

COMPARATOR

 

 

 

 

NO. 1

 

 

15

 

 

 

R1

FC #2

 

CLEAR

 

 

 

 

 

 

 

VREF

 

FC #1

 

 

 

 

 

 

 

 

"FINE"

 

 

 

 

COMPARATOR

Соседние файлы в папке different