Добавил:
Опубликованный материал нарушает ваши авторские права? Сообщите нам.
Вуз: Предмет: Файл:

Patterson, Bailey - Solid State Physics Introduction to theory

.pdf
Скачиваний:
1117
Добавлен:
08.01.2014
Размер:
7.07 Mб
Скачать

 

 

11.1 Summary About Important Defects (B) 589

 

 

 

 

Table 11.1. Summary of common crystal lattice defects

 

 

 

 

 

Point defects

Comments

 

 

 

 

 

Foreign atoms

Substitutional or interstitial

 

Vacancies

Schottky defect is vacancy with atom transferred to

 

 

surface

 

Antisite

Example: A on a B site in an AB compound

 

Frenkel

Vacancy with foreign atom transferred to interstice

 

Color centers

Several types – F is vacancy with trapped electron (ionic

 

 

crystals – see Sect. 11.4

 

Donors and acceptors

Main example are shallow defects in semiconductors –

 

 

see Sects. 11.2 and 11.3

 

Deep levels in

See Sects. 11.2 and 11.3

 

semiconductors

 

 

 

Line defects

Comments

 

 

 

 

 

Dislocations

Edge and screw – see Sect. 11.6 – General dislocation is a

 

 

combination of these two

 

 

 

 

 

Surface defects

Comments

 

 

 

 

 

External

 

 

 

Tamm and Shockley

See Sect. 11.1

 

electronic states

 

 

 

Reconstruction

See Sect. 12.2

 

Internal

 

 

 

Stacking fault

Example: a result of an error in growth2

 

Grain boundaries

Tilt between adjacent crystallites – can include low angle

 

 

(with angle, in radians, being the ratio of the Burgers

 

 

vector (magnitude) to the dislocation spacing) to large

 

 

angle (which includes twin boundaries)

 

Heteroboundary

Between different crystals

 

 

 

 

 

Volume defects

Comments

 

 

 

 

 

Many examples

Three-dimensional precipitates and complexes of defects

 

 

 

 

See, e.g., Henderson [11.16].

Vacancies, substitutional atoms, and interstitial atoms are all point defects. Surfaces are planar defects. There is another class of defects called line defects. Dislocations are important examples of line defects, and they will be discussed

2A fcc lattice along (1,1,1) is composed of planes ABCABC etc. If an A plane is missing then we have ABCBCABC, etc. This introduces a local change of symmetry. See, e.g., Kittel [23, p. 18].

590 11 Defects in Solids

later (Sect. 11.6). They are important for determining how easily crystals deform and may also relate to crystal growth.

Finally, there are defects that occur over a whole volume. It is usually hard to grow a single crystal. In a single crystal, the lattice planes are all arranged as expected–in a perfectly regular manner. When we are presented with a chunk of material, it is usually in a polycrystal form. That is, many little crystals are stuck together in a somewhat random way. The boundary between crystals is also a twodimensional defect called a grain boundary. We have summarized these ideas in Table 11.1.

11.2Shallow and Deep Impurity Levels in Semiconductors (EE)

We start by considering a simple chemical model of shallow donor and acceptor defects. We will give a better definition later, but for now, by “shallow”, we will mean energy levels near the bottom of the conduction band for donor level and near the top of the valence band for acceptors.

Consider Si14 as the prototype semiconductor. In the usual one-electron shell notation, its electron structure is denoted by

1s2 2s2 2p6 3s2 3p2 .

There are four valence electrons in the 3s23p2 shell, which requires eight to be filled. We think of neighboring Si atoms sharing electrons to fill the shells. This sharing lowers energy and binds the electrons. We speak of covalent bonds. Schematically, in two dimensions, we picture this occurring as in Fig. 11.3. Each line represents a shared electron. By sharing, each Si in the outer shell has eight electrons. This is of course like the discussion we gave in Chap. 1 of the bonding of C to form diamond.

 

Si

 

Si

Si

Si

 

Si

 

Fig. 11.3. Chemical model of covalent bond in Si

11.3 Effective Mass Theory, Shallow Defects, and Superlattices (A)

591

 

 

Now, suppose we have an atom, say As, which substitutionally replaces a Si. The sp shell of As has five electrons (4s24p3) and only four are needed to “fill the shell”. Thus, As acts as a donor with an additional loosely bound electron (with a large orbit encompassing many atoms), which can be easily excited into the conduction band at room temperature.

An acceptor like In (with three electrons in its outer sp shell (5s25p)) needs four electrons to complete its covalent bonds. Thus, In can accept an electron from the valence band, leaving behind a hole. The combined effects of effective mass and dielectric constant cause the carrier to be bound much less tightly than in an analogous hydrogen atom. The result is that donors introduce energy levels just below the conduction-band minimum and acceptors introduce levels just above the top of the valence band. We discuss this in more detail below.

In brief, it turns out that the ground-state donor energy level is given by (atomic units, see the appendix)

En = −

m / m

,

(11.1)

2n2ε2

 

 

 

where m*/m is the effective mass ratio typically about 0.25 for Si and ε is the dielectric constant (about 11.7 in Si). En in (11.1) is measured from the bottom of the conduction band. Except for the use of the dielectric constant and the effective mass, this is the same result as obtained from the theory of the energy levels of hydrogen. A similar, remarkably simple result holds for acceptor states. These results arise from pioneering work by Kohn and Luttinger as discussed in [11.17], and we develop the basics below.

11.3Effective Mass Theory, Shallow Defects, and Superlattices (A)

11.3.1 Envelope Functions (A)

The basic model we will use here is called the envelope approximation.3 It will allow us to justify our treatments of effective mass theory and of shallow defects in semiconductors. With a few more comments, we will then be able to relate it to a simple approach to superlattices, which will be discussed in more detail in Chap. 12.

Let

H 0 = −

2

2

+V (r) ,

(11.2)

 

2m

 

 

 

 

3 Besides [11.17], see also Luttinger and Kohn [11.22] and Madelung [11.23].

592 11 Defects in Solids

where V(r) is the periodic potential. Let H = H0 + U where U = VD(r) is the extra

defect potential. Now, H0ψn(k, r) = Enψn(k, r) and Hψ = . We expand the wave function in Bloch functions

ψ = n,k an (k)ψn (k, r) ,

(11.3)

where n is the band index. Also, since En(k) is a periodic function in k-space, we can expand it in a Fourier series with the sum restricted to lattice points

En (k) = m Fnmeik Rm .

(11.4)

We define an operator En(−i ) by substituting −i for k:

En (i )ψn (k, r) = m FnmeRm ψn (k, r)

=

m

F

[1+ R

+

1

(R )2

+…]ψ

n

(k, r)

(11.5)

 

 

nm

m

2

m

 

 

 

= m Fnmψn (k, r + Rm ) ,

 

 

 

 

by the properties of Taylor’s series. Then using Bloch’s theorem

 

 

 

En (i )ψn (k, r) = m Fnmeik Rmψn (k, r) ,

 

 

(11.6)

and by (11.4)

 

 

 

 

 

 

 

 

 

 

En (i )ψn (k, r) = En (k)ψn (k, r) .

 

 

 

(11.7)

Substituting (11.3) into Hψ = , we have (using the fact that ψn is an eigenfunction of H0 with eigenvalue En(k))

n,k En (k)an (k)ψn (k, r) + n,k VDan (k)ψn (k, r)

(11.8)

= n,k Ean (k)ψn (k, r).

 

If we use (11.4) and (11.6), this becomes

 

n,k an (k)[En (i ) +VD ]ψn (k, r) = Eψ .

(11.9)

11.3.2 First Approximation (A)

We neglect band-to-band interactions and hence, neglect the summation over n. Dropping n entirely from (11.9), we have

ψ = k a(k)ψ (k, r) ,

(11.10)

and

 

[E(i ) +VD ]ψ (k, r) = Eψ .

(11.11)

11.3 Effective Mass Theory, Shallow Defects, and Superlattices (A)

593

 

 

11.3.3 Second Approximation (A)

We assume a large extension in real space that means that only a small range of k values are important – say the ones near a parabolic (assumed for simplicity) minimum at k = 0 (Madelung op. cit. Chap. 9).

We assume, then,

ψ(k, r) = eik ru(k, r) eik ru(0, r) = eik rψ(0, r)

(11.12)

so using (11.10) and (11.12),

 

ψ = F(r)ψ(0, r) ,

(11.13)

where

 

F (r) = k a(k)eik r .

(11.14)

So, we have by (11.11)

 

[E(i ) +VD ]F(r)ψ (0, r) = EF(r)ψ (0, r) .

(11.15)

Using the definition of E(−i ) as in (11.5) we have with n suppressed,

 

m Fm F (r + Rm )ψ (0, r + Rm ) = (E VD ) F (r)ψ (0, r) .

(11.16)

But, ψ(0, r + Rm) = ψ(0, r), so it can be cancelled. Thus retracing our steps, we have

[E(i ) +VD ]F(r) = EF(r) .

(11.17)

This simply means that a rapidly varying function has been replaced by a slowly varying function F(r) called the “envelope” function. This immediately leads to the concept of shallow donors. Consider the bottom of a parabolic conductor band near k = 0 and expand about k = 0;

E(i ) = Ec + dE

 

 

 

 

 

(i ) +

1 d2E

(i )2 .

 

 

 

 

 

dk

 

k =0

 

 

 

 

 

2 dk 2

 

 

 

 

 

 

 

 

Also,

 

 

 

 

 

 

 

 

 

 

 

 

dE

 

 

= 0 ,

 

 

 

 

 

 

 

 

 

dk

 

k =0

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

and

 

 

 

 

 

 

 

 

 

 

 

 

d2E

 

 

2

 

 

 

 

 

 

 

dk 2

 

 

 

 

 

=

 

 

,

 

 

 

 

k =0

m

 

 

 

 

 

 

 

 

 

 

 

 

 

where m* is the effective mass. Thus, we find

 

 

E(i ) = Ec

2

 

 

2 .

 

 

 

 

2m

 

 

 

 

 

 

 

 

 

 

 

(11.18)

(11.19)

(11.20)

(11.21)

594 11 Defects in Solids

And, if VD = e2/4πεr, our resulting equation is

 

 

2

 

 

e

2

 

 

 

 

 

 

 

2

 

F(r) = (E E

c

)F(r) .

(11.22)

 

 

 

 

 

 

2m

 

 

 

 

 

 

 

 

 

 

 

 

4πεr

 

 

 

Except for the use of ε and m*, these solutions are just hydrogenic wave functions and energies, and so our use of the hydrogenic solution (11.1) is justified.

Now let us discuss briefly electron and hole motion in a perfect crystal. If U = 0, we simply write

 

2

 

 

 

 

 

2 + E

F = EF .

(11.23)

2m

 

 

 

c

 

 

 

e

 

 

 

On the other hand, suppose U is still 0, but consider a valence band with a maximum at k = 0. We then can expand about that point with the following result:

E(i ) = Ev +

1 d2E

(i )2 .

(11.24)

 

2 dk 2

 

 

Using the hole mass, which has the opposite sign for the electron mass (mh = −me), we can write

E(i ) = E

 

+

2

( 2 ) ,

(11.25)

v

 

2m

 

 

 

h

 

 

so the relevant Schrödinger equation becomes

 

2

( 2 ) E

 

 

 

 

 

v

F = −EF .

(11.26)

2m

 

 

 

 

 

h

 

 

 

 

Looking at (11.23) and (11.26), we see how discontinuities in band energies can result in effective changes in the potential for the carriers, and we see why the hole energies are inverted from the electron energies.

Now let us consider superlattices with a set of layers so there is both a lattice periodicity in each layer and a periodicity on a larger scale due to layers (see Sect. 12.6). The layers A and B could for example be laid down as ABABAB…

There are several more considerations, however, before we can apply these results to superlattices. First, we have to consider that if we are to move from a region of one band structure (layer) to another (layer), the effective mass changes since adjacent layers are different. With the possibility of change in effective mass, the Hamiltonian is often written as

 

2

 

 

1

 

 

 

 

H = −

 

 

 

 

 

 

 

 

 

 

+V (z) ,

(11.27)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2 z m

 

(z) z

 

 

11.3 Effective Mass Theory, Shallow Defects, and Superlattices (A)

595

 

 

rather than in the more conventional way. This allows the Hamiltonian to remain Hermitian, even with varying m*, and it leads to a probability current density of

 

 

 

 

 

∂ψ

 

ψ

 

∂ψ

 

 

jz (z) =

 

ψ

 

 

 

,

(11.28)

 

 

z

m

z

 

2i m

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

from which we apply the requirement of continuity on ψ and ψ/(m*z) rather than ψ and ψ/z.

We have assumed the thickness of each layer is sufficient that the band structure of the material can be established in this thickness. Basically, we will need both layers to be several monolayers thick. Also, we assume in each layer that the electron wave function is an envelope function (different for different monolayers) times a Bloch function (see (11.13)). Finally, we assume that in each layer U = U0 (a constant appropriate to the layer) and the carrier motion perpendicular to the layers is free-electron-like so,

 

2

 

2m

 

 

 

which means

 

where for each layer

 

 

 

 

 

F(r) = ϕ(z)e

i(kx x+k y y)

,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2

 

 

2

 

 

 

 

 

2d2

 

 

 

 

 

 

 

 

 

i(kx x+k y y)

 

(k

x

+ k

y

)

 

 

 

 

+U

0

ϕ(z)e

 

= EF ,

2m dz2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2

 

 

 

d

2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

+U

0

ϕ(z) = E

z

ϕ(z) ,

 

 

 

2m dz2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

E = Ez

+

 

2

 

 

(kx2

+ k y2 ) .

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2m

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(11.29)

(11.30)

(11.31)

(11.32)

There are many, many complications to the above. We have assumed, e.g., that m*x,y = m*z which may not be so in all cases. The book by Bastard [11.1] can be consulted. See also, Mitin et al [11.25].

In semiconductors, shallow levels are often defined as being near a band edge and deep levels as being near the center of the forbidden energy gap. In more recent years, a different definition has been applied based on the nature of the causing agent. Shallow levels are now defined as defect levels produced by the long-range Coulomb potential of the defect and deep levels4 are defined as being produced by the central cell potential of the defect, which is short ranged. Since

4 See, e.g., Li and Patterson [11.20, 11.21] and references cited therein.

596 11 Defects in Solids

the potential is short range, a modification of the Slater-Koster model, already discussed in Chap. 2, is a convenient starting point for discussing deep defects. Some reasons for the significance of shallow and deep defects are given in Table 11.2. Deep defects are commonly formed by substitutional, interstitial, and antisite atoms and by vacancies.

Table 11.2. Definition and significance of deep and shallow levels

Shallow levels are defect levels produced by the long-range Coulomb potential of defects. Deep Levels are defect levels produced by the central cell potential of defect.

 

Deep level

Shallow level

Energy

May or may not be near band edge.

Near band edge.

 

Spectrum is not hydrogen-like.

Spectrum is hydrogen-like.

Typical

Recombination centers.

Suppliers of carriers.

properties

Compensators.

 

 

Electron–hole generators.

 

11.4 Color Centers (B)

The study of color centers arose out of the curiosity as to what caused the yellow coloration of rock salt (NaCl) and other coloration in similar crystals. This yellow color was particularly noted in salt just removed from a mine. Becquerel found that NaCl could be colored by placing the crystal near a discharge tube. From a fundamental point of view, NaCl should have an infrared absorption due to vibrations of its ions and an ultraviolet absorption due to excitation of the electrons. A perfect NaCl crystal should not absorb visible light, and should be uncolored. The coloration of NaCl must be due, then, to defects in the crystal. The main absorption band in NaCl occurs at about 4650 Å (the “F”-band). This blue absorption is responsible for the yellow color that the NaCl crystal can have. A further clue to the nature of the absorption is provided by the fact that exposure of a colored crystal to white light can result in the bleaching out of the color. Further experiments show that during the bleaching, the crystal becomes photoconductive, which means that electrons have been promoted to the conduction band. It has also been found that NaCl could be colored by heating it in the presence of Na vapor. Some of the Na atoms become part of the NaCl crystal, resulting in a deficiency of Cl and, hence, Clvacancies. Since photoconductive experiments show that F-band defects can release electrons, and since Clvacancies can trap electrons, it seems very suggestive that the defects responsible for the F-band (called “F-centers”) are electrons trapped at Clvacancies. (Note: the “F” comes from the German farbe, meaning “color”.) This is the explanation accepted today. Of course, since some Clvacancies are always present in a NaCl crystal in thermodynamic equilibrium, any sort of radiation that causes electrons to be

11.4 Color Centers (B)

597

 

 

knocked into the Clvacancies will form F-centers. Thus, we have an explanation of Becquerel’s early results as mentioned above.

More generally, color centers are formed when point defects in crystals trap electrons with the resultant electronic energy levels at optical frequencies. Color centers usually form “deep” traps for electrons, rather than “shallow” traps, as donor impurities in semiconductors do, and, their theoretical analysis is complex. Except for relatively simple centers such as F-centers, the analysis is still relatively rudimentary.

Typical experiments that yield information about color centers involve optical absorption, paramagnetic resonance and photoconductivity. The absorption experiments give information about the transition energies and other properties of the transition. Paramagnetic resonance gives wave function information about the trapped electron, while photoconductivity yields information on the quantum efficiency (number of free electrons produced per incident photon) of the color centers.

Mostly by interpretation of experiment, but partly by theoretical analysis, several different color centers have been identified. Some of these are listed below. The notation is

[missing ion | trapped electron | added ion],

where our notation is p ≡ proton, e ≡ electron, − ≡ halide ion, + ≡ alkaline ion, and M++ ≡ doubly charged positive ion. The usual place to find color centers is in ionic crystals.

[−|e|] = F-center

[−|2e|] = F′-center

[ −|2e|] = M-center (?)

[|e|p] = U2-center [+|e|M++] = Z1-center (?).

In Figs 11.4 and 11.5 we give models for two of the less well-known color centers. In these two figures, ions enclosed by boxes indicate missing ions, a dot means an added electron, and a circle includes a substitutionally added ion. We include several references to color centers. See, e.g., Fowler [11.12] or Schulman and Compton [11.28].

Color centers turn out to be surprisingly difficult to treat theoretically with precision. But success has been obtained using modern techniques on, e.g., F centers in LiCl. See, e.g., Louie p. 94, in Chelikowsky and Louie [11.4]. In recent years tunable solid-state lasers have been made using color centers at low temperatures.

598 11 Defects in Solids

M-center models

(a)

(b)

Fig. 11.4. Models of the M-center: (a) Seitz, (b) Van Doorn and Haven. [Reprinted with permission from Rhyner CR and Cameron JR, Phys Rev 169(3), 710 (1968). Copyright 1968 by the American Physical Society.]

A

C

B

D

Fig. 11.5. Four proposed models for Z1-centers [Reprinted with permission from Paus H and Lüty F, Phys Rev Lett 20(2), 57 (1968). Copyright 1968 by the American Physical Society.]

11.5 Diffusion (MET, MS)

Point defects may diffuse through the lattice, while vacancies may provide a mechanism to facilitate diffusion. Diffusion and defects are intimately related, so we give a brief discussion of diffusion. If C is the concentration of the diffusing quantity, Fick’s Law says the flux of diffusing quantities is given by

J = −D

C

,

(11.33)

x

 

 

 

Соседние файлы в предмете Химия