Учебное пособие 800637
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2.Unexpected behavior of transient current in thin PZT films caused by grain-boundary conduction/ L.A. Delimova [et al.] // J. Appl. Phys. – 2017. – V.121.– 224104 (1-9).
3.Depolarization currents in thin ferroelectric films / Yu.V. Podgorny [et al.] // Ferroelectrics. – 2012. – V. 439. – P. 56-61.
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№ 18-29-11062 |
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1. Pan X., Shuai Y., Wu C., Luo W., Sun X., Zeng H., Zhang W. Rectifying filamentary resistive switching in ion-exfoliated LiNbO3 thin films // Appl. Phys. Lett. 2016. V. 108. P. 032904.
53.043, 53.091
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113
1.Wersing, W. In: Piezoelectric Materials in Devices. N. Setter (Ed.); Swiss Federal Institute of Technology, Lausanne, Switzerland. 2002, 29-66.
2.Rybyanets A.N. Porous piezo eramics: theory, technology, and properties / A.N. Rybyanets
//IEEE Trans. UFFC. - 2011. - V.58. - N. 7. - P. 1492-1507.
3. PRAP (Piezoelectric Resonance Analysis Program). TASI Technical Software, Inc.; www.tasitechnical.com
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1. A.V. Skrylev, A.I. Burkhanov, G.M. Akbaeva, L.A. Dykina, Electrophysical and mechanical properties of PZT-based soft ferroelectric material in wide range of temperatures // Ferroelectrics,
V. 538, Issue 1, P. 146-153, 2019. |
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1.Saito Y. Lead-free piezoceramics / Yasuyoshi Saito, Hisaaki Takao, Toshihiko Tani, Tatsuhiko Nonoyama, Kazumasa Takatori, Takahiko Homma, Toshiatsu Nagaya, Masaya Nakamura // Nature. - 2004. - V. 432. - P. 84-87.
2.Reznitchenko L.A. Piezoelectricity in NaNbO3 ceramics / L.A. Reznitchenko, A.V. Turik, E.M. Kuznetsova, V.P. Sakhnenko // J. Phys.: Condens. Matter. - 2001. - V. 13. - P. 38753885.
3.Rybianets A.N. Automatic iterative evaluation of complex material constants of highly attenuating piezocomposites / A.N. Rybianets, R. Tasker // Ferroelectrics. - 2007. - V. 360. - P. 90-95.
537.9
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