- •Revision History
- •1.1 Features
- •2 Introduction
- •2.1 Description
- •2.2 Pin Assignments
- •2.2.1 Ball Grid Array (GZZ and ZZZ)
- •2.2.3 Signal Descriptions
- •3 Functional Overview
- •3.1 Memory
- •3.1.3 Instruction Cache
- •3.1.4 Memory Map
- •3.1.5 Boot Configuration
- •3.2 Peripherals
- •3.3 Configurable External Ports and Signals
- •3.3.1 Parallel Port Mux
- •3.3.2 Host Port Mux
- •3.3.3 Serial Port 2 Mux
- •3.3.4 External Bus Selection Register (XBSR)
- •3.4 Configuration Examples
- •3.5 Timers
- •3.5.1 Timer Interrupts
- •3.5.2 Timer Pins
- •3.5.3 Timer Signal Selection Register (TSSR)
- •3.6 Universal Asynchronous Receiver/Transmitter (UART)
- •3.9 Direct Memory Access (DMA) Controller
- •3.9.1 DMA Channel 0 Control Register (DMA_CCR0)
- •3.10 System Clock Generator
- •3.10.1 Input Clock Source
- •3.10.2 Clock Groups
- •3.10.3 EMIF Input Clock Selection
- •3.10.4 Changing the Clock Group Frequencies
- •3.10.5 PLL Control Registers
- •3.10.6 Reset Sequence
- •3.11 Idle Control
- •3.11.1 Clock Domains
- •3.11.2 IDLE Procedures
- •3.11.3 Module Behavior at Entering IDLE State
- •3.11.4 Wake-Up Procedure
- •3.11.5 Auto-Wakeup/Idle Function for McBSP and DMA
- •3.11.6 Clock State of Multiplexed Modules
- •3.11.7 IDLE Control and Status Registers
- •3.12 General-Purpose I/O (GPIO)
- •3.13 External Bus Control Register
- •3.13.1 External Bus Control Register (XBCR)
- •3.14 Internal Ports and System Registers
- •3.14.1 XPORT Interface
- •3.14.2 DPORT Interface
- •3.14.3 IPORT Interface
- •3.14.4 System Configuration Register (CONFIG)
- •3.15 CPU Memory-Mapped Registers
- •3.16 Peripheral Registers
- •3.17 Interrupts
- •3.17.1 IFR and IER Registers
- •3.17.2 Interrupt Timing
- •3.17.3 Interrupt Acknowledge
- •3.18 Notice Concerning TCK
- •4 Support
- •4.1 Notices Concerning JTAG (IEEE 1149.1) Boundary Scan Test Capability
- •4.1.1 Initialization Requirements for Boundary Scan Test
- •4.1.2 Boundary Scan Description Language (BSDL) Model
- •4.2 Documentation Support
- •5 Specifications
- •5.1 Electrical Specifications
- •5.3 Recommended Operating Conditions
- •5.5 Timing Parameter Symbology
- •5.6 Clock Options
- •5.6.1 Internal System Oscillator With External Crystal
- •5.6.2 Layout Considerations
- •5.6.3 Clock Generation in Bypass Mode (APLL Disabled)
- •5.6.4 Clock Generation in Lock Mode (APLL Synthesis Enabled)
- •5.6.5 EMIF Clock Options
- •5.7 Memory Timings
- •5.7.1 Asynchronous Memory Timings
- •5.7.2 Programmable Synchronous Interface Timings
- •5.7.3 Synchronous DRAM Timings
- •5.8 HOLD/HOLDA Timings
- •5.9 Reset Timings
- •5.10 External Interrupt and Interrupt Acknowledge (IACK) Timings
- •5.11 XF Timings
- •5.12 General-Purpose Input/Output (GPIOx) Timings
- •5.13 Parallel General-Purpose Input/Output (PGPIOx) Timings
- •5.14 TIM0/TIM1/WDTOUT Timings
- •5.14.1 TIM0/TIM1/WDTOUT Timer Pin Timings
- •5.14.3 TIM0/TIM1/WDTOUT Interrupt Timings
- •5.15 Multichannel Buffered Serial Port (McBSP) Timings
- •5.15.1 McBSP Transmit and Receive Timings
- •5.15.3 McBSP as SPI Master or Slave Timings
- •5.16 Host-Port Interface Timings
- •5.16.1 HPI Read and Write Timings
- •5.16.3 HPI.HAS Interrupt Timings
- •5.17 Inter-Integrated Circuit (I2C) Timings
- •5.18 Universal Asynchronous Receiver/Transmitter (UART) Timings
- •6 Mechanical Data
- •6.1 Package Thermal Resistance Characteristics
- •6.2 Packaging Information
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1 TMS320VC5502
1.1Features
∙High-Performance, Low-Power, Fixed-Point TMS320C55x™ Digital Signal Processor (DSP)
–3.33-/5-ns Instruction Cycle Time
–300-/200-MHz Clock Rate
–16K-Byte Instruction Cache (I-Cache)
–One/Two Instructions Executed per Cycle
–Dual Multipliers [Up to 600 Million Multiply-Accumulates Per Second (MMACS)]
–Two Arithmetic/Logic Units (ALUs)
–One Program Bus, Three Internal Data/Operand Read Buses, and Two Internal Data/Operand Write Buses
∙Instruction Cache (16K Bytes)
∙32K x 16-Bit On-Chip RAM That is Composed of Eight Blocks of 4K × 16-Bit Dual-Access RAM (DARAM) (64K Bytes)
∙16K × 16-Bit One-Wait-State On-Chip ROM (32K Bytes)
∙8M × 16-Bit Maximum Addressable External Memory Space
∙32-Bit External Parallel Bus Memory Supporting External Memory Interface (EMIF) With General-Purpose Input/Output (GPIO) Capabilities and Glueless Interface to:
–Asynchronous Static RAM (SRAM)
–Asynchronous EPROM
–Synchronous DRAM (SDRAM)
–Synchronous Burst RAM (SBRAM)
∙Emulation/Debug Trace Capability Saves Last 16 Program Counter (PC) Discontinuities and Last 32 PC Values
∙Programmable Low-Power Control of Six Device Functional Domains
TMS320VC5502
Fixed-Point Digital Signal Processor
SPRS166J –APRIL 2001 –REVISED AUGUST 2006
∙On-Chip Peripherals
–Six-Channel Direct Memory Access (DMA) Controller
–Three Multichannel Buffered Serial Ports (McBSPs)
–Programmable Analog Phase-Locked Loop (APLL) Clock Generator
–General-Purpose I/O (GPIO) Pins and a Dedicated Output Pin (XF)
–8-Bit/16-Bit Parallel Host-Port Interface (HPI)
–Four Timers
∙Two 64-Bit General-Purpose Timers
∙64-Bit Programmable Watchdog Timer
∙64-Bit DSP/BIOS™ Counter
–Inter-Integrated Circuit (I2C) Interface
–Universal Asynchronous Receiver/ Transmitter (UART)
∙On-Chip Scan-Based Emulation Logic
∙IEEE Std 1149.1(1) (JTAG) Boundary Scan
Logic
∙Packages:
–176-Terminal LQFP (Low-Profile Quad Flatpack) (PGF Suffix)
–201-Terminal MicroStar BGA™ (Ball Grid Array) (GZZ and ZZZ Suffixes)
∙3.3-V I/O Supply Voltage
∙1.26-V Core Supply Voltage
(1)IEEE Standard 1149.1 - 1990 Standard Test Access Port and Boundary Scan Architecture
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this document.
TMS320C55x, DSP/BIOS, MicroStar BGA, C55x, eXpressDSP, Code Composer Studio, RTDX, XDS510, TMS320C54x, C54x, TMS320, TMS320C5000 are trademarks of Texas Instruments.
I2C bus is a trademark of Koninklijke Philips Electronics N.V. All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. |
Copyright © 2001–2006, Texas Instruments Incorporated |
Products conform to specifications per the terms of the Texas |
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Instruments standard warranty. Production processing does not |
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necessarily include testing of all parameters. |
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