Scientific Papers

1. Huppauff, M. and Lengeler, B., Surface Analysis of Floatglass by Means of X-Ray Absorption, Reflection, and Fluorescence Analysis, J. Appl. Phys., 1994, vol. 75(2), pp. 785–791.

2. Abbas, K., Midy, P., Brissaud, I., and Chevallier, P., A New Method of Depth Profile Determination by Synchrotron Radiation, Nucl. Instr. Meth. Phys. Res., B, 1992, vol. 71, pp. 204–208.

3. Legrand, F., Raven, C., Rigal, J.M., and Snigirev, A., The Micro-Fluorescence, Imaging, and Diffraction (Micro-FID) Beamline at the ESRF: A New Facility for Investigation of Microsamples by Synchrotron Radiation with High-Energy X-Rays, Abstracts of XRM-96, 1996, p. 44.

4. Jacobsen, C. et al., Diffraction-Limited Imaging in a Scanning Transmission X-Ray Microscope, Optics Commun., 1991, vol. 86, pp. 351–364.

5. Chukalina, M.V., Ushakov, N.G., and Zaitsev, S.I., Signal Formation, Simulation, and Inverse Problem in Fluorescent X-Ray Microscopy Using Focused Beams, Proceedings of the 5th International Conference XRM'96, Wuerzburg, Germany. August 18–24, 1996.

6. Zaitsev, S.I., Ushakov, N.G., and Chukalina, M.V., X-Ray Fluorescent Micro Topography, Izv. Akad. Nauk, Ser. Fiz., 1996, v. 60, no 2, pp. 129–134.

7. Chukalina, M.V., Ushakov, N.G., and Zaitsev, S.I., Signal Formation, Simulation, and Inverse Problem in Scanning Fluorescent X-Ray Microscopy Using Focused Beams for Analyzing the Surface Relief, Scanning Microscopy, 1997 (in press).

8. Zaitsev, S.I., Ushakov, N.G., and Chukalina, M.V., Formation of X-Ray Fluorescent Signals by a Hidden Boundary Film-Substrate, Surface, 1997 (in press).