- •Scientific Papers
- •Scientific Papers
- •Scientific Papers
- •Scientific Papers
- •Scientific Papers
- •Legal Aspects
- •Foreign Collaborators
- •Legal Aspects
- •Contributors
- •Foreign Collaborators
- •Foreign Collaborators
- •Scientific Papers
- •Scientific Papers
- •Foreign Collaborators
- •I.A.Sokolov, and s.I.Stepanov, “Non-steady photovoltage in crystals with long relaxation time of photoconductivity,” Electron.Lett., V.26, pp. 1275-1277 (1990).
- •Foreign Collaborators
- •Foreign Collaborators
- •Scientific Papers
- •Foreign Collaborators
Scientific Papers
1. Huppauff, M. and Lengeler, B., Surface Analysis of Floatglass by Means of X-Ray Absorption, Reflection, and Fluorescence Analysis, J. Appl. Phys., 1994, vol. 75(2), pp. 785–791.
2. Abbas, K., Midy, P., Brissaud, I., and Chevallier, P., A New Method of Depth Profile Determination by Synchrotron Radiation, Nucl. Instr. Meth. Phys. Res., B, 1992, vol. 71, pp. 204–208.
3. Legrand, F., Raven, C., Rigal, J.M., and Snigirev, A., The Micro-Fluorescence, Imaging, and Diffraction (Micro-FID) Beamline at the ESRF: A New Facility for Investigation of Microsamples by Synchrotron Radiation with High-Energy X-Rays, Abstracts of XRM-96, 1996, p. 44.
4. Jacobsen, C. et al., Diffraction-Limited Imaging in a Scanning Transmission X-Ray Microscope, Optics Commun., 1991, vol. 86, pp. 351–364.
5. Chukalina, M.V., Ushakov, N.G., and Zaitsev, S.I., Signal Formation, Simulation, and Inverse Problem in Fluorescent X-Ray Microscopy Using Focused Beams, Proceedings of the 5th International Conference XRM'96, Wuerzburg, Germany. August 18–24, 1996.
6. Zaitsev, S.I., Ushakov, N.G., and Chukalina, M.V., X-Ray Fluorescent Micro Topography, Izv. Akad. Nauk, Ser. Fiz., 1996, v. 60, no 2, pp. 129–134.
7. Chukalina, M.V., Ushakov, N.G., and Zaitsev, S.I., Signal Formation, Simulation, and Inverse Problem in Scanning Fluorescent X-Ray Microscopy Using Focused Beams for Analyzing the Surface Relief, Scanning Microscopy, 1997 (in press).
8. Zaitsev, S.I., Ushakov, N.G., and Chukalina, M.V., Formation of X-Ray Fluorescent Signals by a Hidden Boundary Film-Substrate, Surface, 1997 (in press).
№-0124 Computerized System for Determining the Characteristics of 3D Stochastic Objects |
Full Title: |
Development of a Computerized System for Determining the Characteristics of 3D Stochastic Objects from the Statistical Characteristics of 2D Projections (Stochastic Tomography) |
Technology Field(s): |
INF-SOF: Information and Communications / Software |
Contributors
Vasily A Shelokov |
CCB "ALMAZ" (ALMAZ) 80, Leningradskii pr., Moscow, 111024, Russia Phone: 7+095+1759410; 7+095+2619581 Fax: 7+095+1585671; 7+095+2619581 |
Present Status of Research
Brief Description of Research
The goal of the project is the development of methods, devices, and software for determining the characteristics of 3D stochastic objects from the statistical characteristics of their 2D projections.
There are some tentative theoretical results (Liu and Frank, 1995; Ushakov, 1997) and applied results in the field of structural biology.
The object of the project is to solve a fundamentally new problem that involves significant upgrading of the informative potentialities of tomographic methods.
An extended concept of the object in tomographic analysis will be considered involving objects varying with time (during observation), as well as sets of similar (but different) objects, for example, sets of randomly orientated macromolecules, such that each of the projections come from a different particle.
