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Electrical characteristics

STM8S105xx

10.3.5Memory characteristics

RAM and hardware registers

Table 36: RAM and hardware registers

Symbol

Parameter

Conditions

Min

Unit

VRM

Data retention mode (1)

Halt mode (or reset)

VIT-max(2)

V

Notes:

(1)Minimum supply voltage without losing data stored in RAM (in halt mode or under reset) or in hardware registers (only in halt mode). Guaranteed by design, not tested in production. refer to Section 7.10: "TIM1 - 16bit advanced control timer" for the value of VIT-max

(2)Refer to the Operating conditions section for the value of VIT-max

Flash program memory/data EEPROM memory

General conditions: TA = -40 to 125°C.

Table 37: Flash program memory/data EEPROM memory

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

 

 

 

(1)

 

 

 

 

 

 

 

 

 

 

VDD

Operating voltage (all modes,

fCPU ≤ 16

2.95

 

5.5

V

 

execution/write/erase)

MHz

 

 

 

 

 

 

 

 

 

 

 

tprog

Standard programming time (including

 

 

6.0

6.6

ms

 

erase) for byte/word/block (1 byte/4

 

 

 

 

 

 

bytes/128 bytes)

 

 

 

 

 

 

 

 

 

 

 

 

 

Fast programming time for 1 block (128

 

 

3.0

3.3

ms

 

bytes)

 

 

 

 

 

 

 

 

 

 

 

 

terase

Erase time for 1 block (128 bytes)

 

 

3.0

3.3

ms

 

 

 

 

 

 

 

NRW

Erase/write cycles (2)(program memory)

TA = +85 °C

10 k

 

 

cycles

 

Erase/write cycles(data memory) (2)

TA = +125 °

300

1.0M

 

 

 

 

C

k

 

 

 

tRET

Data retention (program memory) after 10k

TRET = 55° C

20

 

 

years

 

erase/write cycles at TA = +85 °C

 

 

 

 

 

 

 

 

 

 

 

 

 

Data retention (data memory) after 10k

TRET = 55° C

20

 

 

 

 

erase/write cycles at TA = +85 °C

 

 

 

 

 

 

 

 

 

 

 

 

 

Data retention (data memory) after 300 k

TRET = 85° C

1.0

 

 

 

 

erase/write cycles at TA = +125 °C

 

 

 

 

 

 

 

 

 

 

 

 

IDD

Supply current (Flash programming or

 

 

2.0

 

mA

 

erasing for 1 to 128 bytes)

 

 

 

 

 

Notes:

(1)Data based on characterization results, not tested in production.

(2)The physical granularity of the memory is 4 bytes, so cycling is performed on 4 bytes even when a write/erase operation addresses a single byte.

60/99

DocID14771 Rev 13

STM8S105xx

Electrical characteristics

10.3.6I/O port pin characteristics

General characteristics

Subject to general operating conditions for VDD and TA unless otherwise specified. All unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or an external pull-up or pull-down resistor.

Table 38: I/O static characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIL

Input low level voltage

 

VDD = 5 V

-0.3

 

0.3 x

V

 

 

 

 

 

 

 

VDD

 

 

 

 

 

 

 

 

 

 

VIH

Input high level voltage

 

 

 

0.7 x

 

VDD +

V

 

 

 

 

 

VDD

 

0.3 V

 

 

 

 

 

 

 

 

 

 

Vhys

Hysteresis (1)

 

 

 

 

700

 

mV

Rpu

Pull-up resistor

VDD = 5 V, VIN = VSS

30

55

80

 

 

 

 

 

 

 

tR, tF

Rise and fall time(10 % -

Fast I/Os load = 50 pF

 

 

35 (2)

 

 

90 %)

 

 

 

 

 

 

Standard and high sink

 

 

125 (2)

ns

 

 

I/Os load = 50 pF

 

 

 

 

 

 

Fast I/Os load = 20 pF

 

 

20 (2)

 

 

 

Standard and high sink

 

 

50 (2)

 

 

 

I/Os load = 20 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

Ilkg

Input leakage current,

VSS

≤ VIN

≤ VDD

 

 

±1.0 (3)

µA

 

analog and digital

 

 

 

 

 

 

 

Ilkg ana

Analog input leakage

VSS

≤ VIN

≤ VDD

 

 

±250 (3)

nA

 

current

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Ilkg(inj)

Leakage current in

Injection current ±4 mA

 

 

±1.0 (3)

µA

 

adjacent I/O (3)

 

 

 

 

 

 

 

Notes:

(1)Hysteresis voltage between Schmitt trigger switching levels. Based on characterization results, not tested in production.

(2)Data guaranteed by design.

(3)Data based on characterization results, not tested in production.

DocID14771 Rev 13

61/99

Electrical characteristics

STM8S105xx

Figure 24: Typical VIL and VIH vs VDD @ 4 temperatures

Figure 25: Typical pull-up resistance vs VDD @ 4 temperatures

62/99

DocID14771 Rev 13

STM8S105xx

Electrical characteristics

 

Figure 26: Typical pull-up current vs VDD @ 4 temperatures

 

 

 

 

 

 

1.The pull-up is a pure resistor (slope goes through 0).

Table 39: Output driving current (standard ports)

Symbol

Parameter

Conditions

Min

Max

Unit

VOL

Output low level with four pins sunk

IIO = 4 mA,

 

1.0 (1)

V

 

 

VDD = 3.3 V

 

 

 

 

 

 

 

 

 

 

Output low level with eight pins sunk

IIO= 10 mA,

 

2.0

 

 

 

VDD = 5 V

 

 

 

 

 

 

 

 

 

VOH

Output high level with four pins sourced

IIO = 4 mA,

2.0 (1)

 

V

 

 

VDD = 3.3 V

 

 

 

 

 

 

 

 

 

 

Output high level with eight pins sourced

IIO = 10 mA,

2.4

 

 

 

 

VDD = 5 V

 

 

 

 

 

 

 

 

 

Notes:

(1) Data based on characterization results, not tested in production

Table 40: Output driving current (true open drain ports)

Symbol

Parameter

Conditions

Max

Unit

VOL

Output low level with two pins sunk

IIO = 10 mA, VDD = 3.3 V

1.5 (1)

V

 

 

IIO = 10 mA, VDD = 5 V

1.0

 

 

 

 

 

 

 

 

IIO = 20 mA, VDD = 5 V

2.0 (1)

 

Notes:

(1) Data based on characterization results, not tested in production

Table 41: Output driving current (high sink ports)

 

Symbol

Parameter

Conditions

Min

Max

Unit

 

VOL

Output low level with four pins sunk

IIO = 10 mA,

 

1.1 (1)

V

 

 

DocID14771 Rev 13

 

 

 

63/99

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