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Embedded Controller Hardware Design (Ken Arnold, 2001).pdf
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100EMBEDDED CONTROLLER

Hardware Design

Another way of classifying memory devices is based on how information is written into the memory. Read/write memories are memories that can be written to as easily as they are read from by the processor.

Read/Write Memories

Static RAM or SRAM refers to a volatile semiconductor read/write memory in which the basic storage element is a flip-flop to store each bit. The flip-flops are arranged in rows and columns and are available in several organizations. The flip-flops take about four transistors per bit of storage, so they are generally about four times less dense than DRAMs that use only one transistor per bit. While these devices are volatile, they will maintain information as long as they are powered, unlike dynamic RAM that must be refreshed.

Dynamic RAM or DRAM, is a memory using a capacitor as the storage element. The presence or absence of charge on the capacitor represents ones and zeros. Because the capacitors are not perfect, they leak charge and will “forget” in as little as a few milliseconds if they are left alone, rather like a small child after being told to clean her room. In order to make the capacitors useful for storage they must be periodically refreshed. This is done by sensing whether there is any charge present on the capacitor and recharging the capacitor if there was charge present when it was sensed.

Refer to Figure 4-5. Charge is stored on the parasitic gate capacitance of a MOSFET transistor so that only one transistor is required per bit of storage. The process of reading or sensing the data is destructive in the sense that the charge representing the data is lost when it is sensed. The DRAM capacitor must be refreshed whenever it is read, and also periodically to restore the charge that leaks away. Each row in a DRAM has a sense amplifier and recharge circuitry designed to read and restore the data on an entire row at once. In order to refresh the DRAM data, a special abbreviated read cycle must be performed for each row of the memory. Because of the high density of data storage in DRAMs such as a 4 megabit device, the memory must have 22 address bits to select the location to be read or written. Rather than using 22 individual pins to specify the location, 11 wires are used and the address is latched by the DRAM in two parts: the row address and the column address. This is referred to as a multiplexed address Two control signals, row address strobe (RAS) and

101CHAPTER FOUR

Memory Technologies and Interfacing

column address strobe (CAS, are used to multiplex the two 11-bit halves of the address into the DRAM. To simplify the refresh process, only the row address is used in a refresh cycle. Doing this takes advan­ tage of the fact that there is one sense and refresh circuit for each bit in a row. The refresh row address is sequenced through all possible addresses before the capacitors can discharge.

One DRAM Bit Cell

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Gate

 

 

SiO2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Semiconductor.

 

 

 

 

 

 

 

Semiconductor.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Source

 

Channel

Drain

 

 

 

 

 

 

 

 

ON or OFF

 

 

 

 

 

 

 

 

 

 

 

 

 

depending on

 

 

 

 

 

 

 

 

 

 

 

 

 

gate voltage

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Charge on gate leaks off slowly,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

and must be “refreshed” periodically

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Gate

SiO2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Bit

 

 

 

Semiconductor.

 

 

 

 

 

 

 

Semiconductor.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Bucket

 

 

 

Source

 

Channel

Drain

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ON

 

 

 

 

 

Read-Only Memory

Figure 4-5: Dynamic RAM bit storage mechanism.

Read-only memory (ROM) is a class of storage that cannot be erased or modi­ fied by the processor. Typical embedded systems may make use of one or more of the following types of ROM: mask ROM PROM, EPROM EEPROM or flash EPROM.

Mask ROM is memory that has been programmed at the time it is manufactured and can never be changed. The data patterns are defined by the photographic masks used to define the circuits on a chip when it is being fabricated. Mask ROMs are used when the programs or data do not need to be changed, when the production quantities are large, and the cost must be as low as possible. This is the oldest form of ROM and is still used in high volume applications because of its very low manufacturing cost. The program must be permanently defined in advance by including it as part of the master artwork film or “masks” used to fabricate the chips. It is also the least flexible to change, as a program change necessitates building and packaging new chips, which can take from weeks to months to accomplish.

PROM is user-programmable ROM, which is often used as a generic term for memories that can be programmed one or more times by the user using a special device called a PROM programmer or PROM burner. This was the first “field programmable” memory, meaning that it can be loaded with data by the

Figure 4-6: EPROM storage mechanism.
OFF or Open due to lack of charge on gate
Drain
Channel
Source
Semiconductor.
Semiconductor.
SiO2
Metal Gate
Metal
Insulating Material
Unprogrammed Bit
can be ON or OFF depending on charge gate
Drain
Channel
Source
Semiconductor.
Semiconductor.
SiO2
Metal Gate
Metal
Insulating Material
Structure
One EPROM Bit Cell
Erasable PROM, or EPROM is used most frequently to store permanent data and programs. It is electrically programmable using an EPROM programmer, and can also be erased by shining a short wavelength ultra violet light through the transparent window in the IC package. The entire memory device is erased since it is not possible to be selective about where the light shines on the chip. These devices are also referred to as UV EPROMs. A one-time programmable (OTP) EPROM is simply an EPROM enclosed in a low cost package without a transparent lid, meaning it cannot be erased once it is programmed. The storage element in an EPROM is similar to that of a DRAM, as shown in Figure 4-6. However, the EPROM storage transistor gate is a conductor float­ ing in an insulating SiO2 (quartz) insulator, which prevents the charge from leaking off. The fact that the
charge is generally guaranteed to remain for at least ten years in the absence of power—as long as the window is covered—
makes this a non-volatile memory. This would be an ideal storage mechanism except for the way that the charge is stored on the
gate. The charge is placed on the floating gate by a method called avalanche induced migration.
This programming method is analogous to routing a river through the room to fill your cup with water. A relatively high voltage, 12 to 25 volts typically,
is used to induce avalanche
102 EMBEDDED CONTROLLER
Hardware Design
end user using special programming equipment. Bipolar fuse-link PROMs were the first in this category, and were programmed by literally burning out fuses selectively from an array. This is where the term “burning” a PROM came from. (Up to now, you probably thought “burning a PROM” was some reference to the Stephen King novel “Carrie,” didn’t you?) Obviously one time program­ mable memory like this was expensive, since it was necessary to discard an obsolete device, and reprogram a new one every time a software revision needs to be tested.
EEPROMs, or E2PROMs, are electrically erasable PROMs. They can be erased and written electrically one byte at a time. The mechanism used is similar to the EPROM except that the insulating region is made very thin, on the order of a few angstroms. The charge is transported using an effect referred to as
Figure 4-8: EPROM/EEPROM erasure.
Flash EPROMs are a variation on the standard EPROM, except that
they have been modified so that they do not need to be exposed to UV light to be erased. Like an EPROM, the entire chip is erased at one time, but the erasure is performed electrically using a high reverse polarity voltage to remove the electrons from the gate. They are also easier to program and erase in the application design using relatively simple additional support circuits.
Semiconductor.
Semiconductor.
SiO2
Metal Gate
Metal
++++++++++
+++++++++++
++++++++++
High + Voltage
Charges are drawn off gate electrically
Erasure by Electric Field
EEPROM
Charge leaks off gate
Semiconductor.
Semiconductor.
SiO2
Metal Gate
Metal
Insulating Material
Erasure by UV Light
Transparent
EPROM
UV Transparent Quartz Lid
Ultraviolet Light
UV light photons give electrons energy to leave gate
Figure 4-7: EPROM program and read operation.
EPROM erasure is accomplished by shining high-energy photons (UV
light) onto the floating gates for several minutes, as shown in Figure 4-8. The photons impart enough energy to the trapped electrons to allow them to escape the gate. The EPROM can
be erased and reused many times, which is important when pro­
grams are in development, and when a reusable non-volatile
memory is required. Some of the
larger (less than 1 megabyte) EPROMs are available with a bank switching system to allow access to more locations than can be
directly accessed using the address lines. This is accomplished using a write cycle to load the upper address bits into a latch inside
the EPROM.
ON

103CHAPTER FOUR

Memory Technologies and Interfacing

current flow across the insulating region for up to 50 milliseconds, and some of the charge is stranded on the floating gate. Figure 4-7 illustrates the program and read operations of a typical EPROM.

 

Reading a Bit

 

Charged

Insulating

 

 

Gate

 

 

 

 

 

 

 

 

 

 

 

 

 

Material

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Metal

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Metal Gate

 

 

SiO2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Semiconductor.

 

 

 

 

 

 

 

 

Semiconductor.

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Source Channel Drain