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IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

 

1.6

 

 

 

 

 

 

 

 

 

0.8

 

 

 

 

 

 

 

 

Eoff

 

 

 

 

 

 

 

 

 

Eoff

 

 

 

 

 

 

 

Eon

 

 

 

 

 

 

 

 

 

Eon

 

 

 

 

 

 

1.4

Ets

 

 

 

 

 

 

 

 

0.7

Ets

 

 

 

 

 

E[mJ]LOSSESENERGYSWITCHING,

1.2

 

 

 

 

 

 

 

 

E[mJ]LOSSESENERGYSWITCHING,

0.6

 

 

 

 

 

 

1.0

 

 

 

 

 

 

 

 

0.5

 

 

 

 

 

 

0.8

 

 

 

 

 

 

 

 

0.4

 

 

 

 

 

 

0.6

 

 

 

 

 

 

 

 

0.3

 

 

 

 

 

 

0.4

 

 

 

 

 

 

 

 

0.2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.2

 

 

 

 

 

 

 

 

 

0.1

 

 

 

 

 

 

 

0.0

 

 

 

 

 

 

 

 

 

0.0

 

 

 

 

 

 

 

5

15

25

35

45

55

65

75

85

 

25

50

75

100

125

150

175

 

 

 

rG, GATE RESISTOR [Ω]

 

 

 

 

Tvj, JUNCTION TEMPERATURE [°C]

 

 

Figure 13. Typical switching energy losses as a

 

 

Figure 14. Typical switching energy losses as a

 

 

 

function of gate resistor

 

 

 

 

 

function of junction temperature

 

 

 

(inductive load, Tvj=150°C, VCE=400V,

 

 

 

(inductive load, VCE=400V, VGE=15/0V,

 

 

 

VGE=15/0V, IC=20A, Dynamic test circuit in

 

 

IC=20A, rG=15Ω,Dynamic test circuit in

 

 

 

Figure E)

 

 

 

 

 

 

 

 

Figure E)

 

 

 

 

 

 

1.0

 

 

 

 

 

 

 

 

 

16

 

 

 

 

 

 

 

 

Eoff

 

 

 

 

 

 

 

 

 

130V

 

 

 

 

 

 

0.9

Eon

 

 

 

 

 

 

 

 

 

520V

 

 

 

 

 

 

Ets

 

 

 

 

 

 

 

 

14

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

[mJ]LOSSESENERGYSWITCHING,

0.8

 

 

 

 

 

 

 

 

VGEGATE,-[V]VOLTAGEEMITTER

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

12

 

 

 

 

 

 

0.7

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.6

 

 

 

 

 

 

 

 

10

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.5

 

 

 

 

 

 

 

 

8

 

 

 

 

 

 

0.4

 

 

 

 

 

 

 

 

6

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.3

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

4

 

 

 

 

 

 

0.2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

E

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.1

 

 

 

 

 

 

 

 

 

2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.0

 

 

 

 

 

 

 

 

 

0

 

 

 

 

 

 

 

200

250

 

300

350

400

 

450

500

 

0

20

 

40

60

80

100

 

 

VCE, COLLECTOR-EMITTER VOLTAGE [V]

 

 

 

QGE, GATE CHARGE [nC]

 

 

 

Figure 15. Typical switching energy losses as a

 

 

Figure 16. Typical gate charge

 

 

 

 

 

function of collector emitter voltage

 

 

 

(IC=40A)

 

 

 

 

 

 

 

(inductive load, Tvj=150°C, VGE=15/0V,

 

 

 

 

 

 

 

 

 

 

 

IC=20A, rG=15Ω,Dynamic test circuit in

 

 

 

 

 

 

 

 

 

 

 

Figure E)

 

 

 

 

 

 

11

 

 

 

 

Rev. 1.2, 2013-12-18

 

 

 

 

 

 

 

 

 

 

 

 

 

 

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

 

1E+4

 

 

1

 

 

 

 

 

 

Ciss

 

 

 

 

 

 

,CAPACITANCE[pF]C

 

Coss

,TRANSIENTTHERMALRESISTANCE[K/W]c)

 

 

 

 

 

 

Crss

 

 

 

 

 

 

 

 

 

 

 

 

 

 

1000

 

 

 

 

 

D=0.5

 

 

 

 

 

 

 

0.2

 

 

 

 

 

 

 

 

 

 

 

 

 

0.1

 

 

0.1

 

 

 

 

 

 

 

 

0.05

 

 

 

 

 

 

 

 

0.02

 

 

100

 

 

 

 

 

0.01

 

 

 

 

 

 

 

 

single pulse

 

 

 

 

0.01

 

 

 

 

 

10

 

 

 

 

 

 

 

 

 

 

th(j-

 

 

 

 

 

 

 

 

Z

i:

1

2

3

4

 

 

 

 

 

 

 

 

ri[K/W]:

0.08245484

0.144197

0.2151774

0.1581708

 

 

 

 

τi[s]:

7.3E-5

7.0E-4

0.01235548

0.08020881

1

 

 

 

 

 

 

 

 

0.001

 

 

 

 

 

 

0

5

10

 

15

20

25

30

 

1E-6

1E-5

1E-4

0.001

0.01

0.1

1

VCE, COLLECTOR-EMITTER VOLTAGE [V]

 

 

 

 

tp, PULSE WIDTH [s]

 

 

Figure 17. Typical capacitance as a function of

 

 

Figure 18. IGBT transient thermal resistance

 

 

collector-emitter voltage

 

 

 

 

 

(D=tp/T)

 

 

 

 

 

 

(VGE=0V, f=1MHz)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

130

 

 

 

 

 

 

1

 

 

 

 

 

 

 

 

 

 

Tj=25°C, IF = 20A

 

 

 

 

 

 

 

 

 

 

120

 

Tj=150°C, IF = 20A

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

D=0.5

 

 

110

 

 

 

 

 

 

 

 

 

 

 

0.2

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.1

 

 

 

100

 

 

 

 

 

 

0.1

 

 

 

 

0.05

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

0.02

 

 

 

90

 

 

 

 

 

 

 

 

 

 

 

0.01

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

single pulse

 

 

80

 

 

 

 

 

 

0.01

 

 

 

 

 

 

 

 

70

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

[K/W]RESISTANCETHERMALTRANSIENT,c)

 

 

 

 

 

 

 

[ns]TIMERECOVERYREVERSE,trr

60

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

th(j-

 

 

 

 

 

 

 

 

50

 

 

 

 

 

 

Z

 

 

i:

1

2

3

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ri[K/W]: 0.6701584 0.775759

0.3540826

 

 

 

 

 

 

 

 

 

 

 

 

τi[s]: 3.4E-4

4.7E-3

0.04680901

 

 

 

 

 

 

 

 

 

0.001

 

 

 

 

 

 

 

 

40

 

 

 

 

 

 

1E-7

1E-6

1E-5

1E-4

0.001

0.01

0.1

1

 

500

700

900

 

1100

1300

1500

 

 

tp, PULSE WIDTH [s]

 

 

 

 

diF/dt, DIODE CURRENT SLOPE [A/µs]

 

Figure 19. Diode transient thermal impedance as a

 

Figure 20. Typical reverse recovery time as a function

 

function of pulse width

 

 

 

 

 

of diode current slope

 

 

 

(D=tp/T)

 

 

 

 

 

 

 

(VR=400V)

 

 

 

 

 

 

 

 

 

 

 

 

12

 

 

 

 

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

 

1.2

 

 

 

 

 

 

20

 

 

 

 

 

 

 

 

Tj=25°C, IF = 20A

 

 

 

 

19

Tj=25°C, IF = 20A

 

 

 

 

 

Tj=150°C, IF = 20A

 

 

 

 

Tj=150°C, IF

= 20A

 

 

 

 

 

 

 

 

 

 

 

 

 

Qrr[µC]CHARGERECOVERYREVERSE,

 

 

 

 

 

 

Irr[A]CURRENTRECOVERYREVERSE,

18

 

 

 

 

 

 

1.0

 

 

 

 

 

17

 

 

 

 

 

 

 

 

 

 

 

 

16

 

 

 

 

 

 

 

 

 

 

 

 

15

 

 

 

 

 

 

0.8

 

 

 

 

 

14

 

 

 

 

 

 

 

 

 

 

 

 

13

 

 

 

 

 

 

 

 

 

 

 

 

12

 

 

 

 

 

 

0.6

 

 

 

 

 

11

 

 

 

 

 

 

 

 

 

 

 

 

10

 

 

 

 

 

 

0.4

 

 

 

 

 

9

 

 

 

 

 

 

 

 

 

 

 

8

 

 

 

 

 

 

 

 

 

 

 

 

7

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

6

 

 

 

 

 

 

 

0.2

 

 

 

 

 

 

5

 

 

 

 

 

 

 

500

700

900

1100

1300

1500

 

500

700

 

900

1100

1300

1500

 

 

diF/dt, DIODE CURRENT SLOPE [A/µs]

 

 

 

diF/dt, DIODE CURRENT SLOPE [A/µs]

 

 

Figure 21. Typical reverse recovery charge as a

 

 

Figure 22. Typical reverse recovery current as a

 

 

 

function of diode current slope

 

 

 

function of diode current slope

 

 

 

(VR=400V)

 

 

 

 

 

 

(VR=400V)

 

 

 

 

 

0

 

 

 

 

 

 

60

 

 

 

 

 

 

 

 

Tj=25°C, IF = 20A

 

 

 

 

 

Tj=25°C

 

 

 

 

 

 

 

Tj=150°C, IF = 20A

 

 

 

 

 

Tj=150°C

 

 

 

 

 

-50

 

 

 

 

 

 

50

 

 

 

 

 

 

rr/dtoffallofratepeakdiode,Irr[A/µs]

 

 

 

 

 

 

 

 

 

 

 

 

 

-100

 

 

 

 

 

IF[A]CURRENTFORWARD,

 

 

 

 

 

 

 

-150

 

 

 

 

 

40

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

-200

 

 

 

 

 

30

 

 

 

 

 

 

-250

 

 

 

 

 

20

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

-300

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

dI

 

 

 

 

 

 

 

10

 

 

 

 

 

 

 

-350

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

-400

 

 

 

 

 

 

0

 

 

 

 

 

 

 

500

700

900

1100

1300

1500

 

0.0

0.5

1.0

1.5

2.0

2.5

3.0

 

 

diF/dt, DIODE CURRENT SLOPE [A/µs]

 

 

 

VF, FORWARD VOLTAGE [V]

 

 

Figure 23. Typical diode peak rate of fall of reverse

 

Figure 24. Typical diode forward current as a function

 

 

recovery current as a function of diode

 

 

of forward voltage

 

 

 

 

 

current slope

 

 

 

 

 

 

 

 

 

 

 

 

 

(VR=400V)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

13

 

 

 

 

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

2.0

 

 

 

 

 

 

 

 

 

 

 

IF=10A

 

 

 

 

 

 

IF=20A

 

 

 

 

 

 

IF=40A

 

1.8

 

 

 

 

 

 

1.6

 

 

 

 

 

 

1.4

 

 

 

 

 

 

1.2

 

 

 

 

 

 

[V]VOLTAGEFORWARD,VF

 

 

 

 

 

 

1.0

 

 

 

 

 

 

0.8

 

 

 

 

 

 

25

50

75

100

125

150

175

 

Tvj, JUNCTION TEMPERATURE [°C]

 

Figure 25. Typical diode forward voltage as a function

 

of junction temperature

 

 

 

14

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

PG-TO247-3

15

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

PG-TO220-3

16

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

vGE(t)

90% VGE

iC(t)

90% IC

10% IC

vCE(t)

 

td(off)

 

tf

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

vGE(t)

90% VGE

iC(t)

2% IC

vCE(t)

t2

Eoff =t1VCE x IC x dt

t1

t2

 

 

 

 

a

b

 

10% VGE

a

b

 

t

 

 

 

 

 

 

 

 

 

90% IC

 

 

 

 

 

 

 

 

 

10% IC

t

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

τ

 

td(on)

 

tr

 

t

 

 

 

 

 

 

 

 

 

 

 

 

 

10% VGE

t

 

CC

t

 

t4

 

Eon =

VCE x IC x dt

 

t3

 

 

2% VCE

t

t3

t4

 

17

Rev. 1.2, 2013-12-18

IKW40N65H5, IKP40N65H5

High speed switching series fifth generation

Revision History

IKW40N65H5, IKP40N65H5

Revision: 2013-12-18, Rev. 1.2

Previous Revision

Revision

Date

Subjects (major changes since last revision)

 

 

 

1.1

2012-11-09

Preliminary data sheet

 

 

 

1.2

2013-12-18

New Marking Pattern

 

 

 

We Listen to Your Comments

Any information within this document that you feel is wrong, unclear or missing at all ?

Your feedback will help us to continuously improve the quality of this document.

Please send your proposal (including a reference to this document) to: erratum@infineon.com

Published by

Infineon Technologies AG

81726 Munich, Germany

81726 München, Germany

© 2014 Infineon Technologies AG All Rights Reserved.

Legal Disclaimer

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party.

Information

For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon

Technologies Office (www.infineon.com).

Warnings

Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office.

The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

18

Rev. 1.2, 2013-12-18

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