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1/05—Revision 0: Initial Version

Rev. 0 | Page 2 of 16

AD8397

SPECIFICATIONS

VS = ±1.5 V or +3 V (@ TA = 25°C, G = +1, RL = 25 Ω, unless otherwise noted).

Table 1.

Parameter

Test Conditions/Comments

Min Typ Max

Unit

DYNAMIC PERFORMANCE −3 dB Bandwidth

0.1 dB Flatness

Large Signal Bandwidth Slew Rate

VOUT = 0.1 V p-p VOUT = 0.1 V p-p VOUT = 2.0 V p-p VOUT = 0.8 V p-p

50 3.6 9 32

MHz MHz MHz V/µs

NOISE/DISTORTION PERFORMANCE Distortion (Worst Harmonic) Input Voltage Noise

Input Current Noise

fC = 100 kHz, VOUT = 1.4 V p-p, G = +2 f = 100 kHz

f = 100 kHz

−90 4.5 1.5

dBc nV/ÖHz pA/ÖHz

DC PERFORMANCE Input Offset Voltage

Input Offset Voltage Match Input Bias Current

Input Offset Current Open-Loop Gain

TMIN − TMAX

TMIN − TMAX

VOUT = ±0.5 V

1.0 2.5 2.5

1.0 2.0 200 900 1.3

50 300 81 88

mV mV mV nA µA nA dB

INPUT CHARACTERISTICS Input Resistance

Input Capacitance Common-Mode Rejection

f = 100 kHz

∆VCM = ±1 V

87 1.4

−71 −80

kΩ pF dB

OUTPUTCHARACTERISTICS Output Resistance +Swing

−Swing +Swing −Swing

Maximum Output Current

RLOAD = 25 Ω RLOAD = 25 Ω RLOAD = 100 Ω RLOAD = 100 Ω

SFDR £ −70 dBc, f = 100 kHz, VOUT = 0.7 VP, RLOAD = 4.1 Ω

0.2 +1.39 +1.43

−1.4 −1.37 +1.45 +1.48

−1.47 −1.44 170

Ω VP VP VP VP mA

POWER SUPPLY

Operating Range (Dual Supply) Supply Current

Power Supply Rejection

∆VS = ±0.5 V

±1.5 ±12.0 6 7 8.5 −70 −82

V mA/Amp dB

Rev. 0 | Page 3 of 16

AD8397

VS = ±2.5V or +5 V (@ TA = 25°C, G = +1, RL = 25 Ω, unless otherwise noted).

Table 2.

Parameter

Test Conditions/Comments

Min Typ Max

Unit

DYNAMIC PERFORMANCE −3 dB Bandwidth

0.1 dB Flatness

Large Signal Bandwidth Slew Rate

VOUT = 0.1 V p-p VOUT = 0.1 V p-p VOUT = 2.0 V p-p VOUT = 2.0 V p-p

60 4.8 14 53

MHz MHz MHz V/µs

NOISE/DISTORTION PERFORMANCE Distortion (Worst Harmonic) Input Voltage Noise

Input Current Noise

fC = 100 kHz, VOUT = 2 V p-p, G = +2 f = 100 kHz

f = 100 kHz

−98 4.5 1.5

dBc nV/ÖHz pA/ÖHz

DC PERFORMANCE Input Offset Voltage

Input Offset Voltage Match Input Bias Current

Input Offset Current Open-Loop Gain

TMIN − TMAX

TMIN − TMAX

VOUT = ±1.0 V

1.0 2.4 2.5

1.0 2.0 200 900 1.3

50 300 85 90

mV mV mV nA µA nA dB

INPUT CHARACTERISTICS Input Resistance

Input Capacitance Common-Mode Rejection

f = 100 kHz

∆VCM = ±1 V

87 1.4

−76 −80

kΩ pF dB

OUTPUTCHARACTERISTICS Output Resistance +Swing

−Swing +Swing −Swing

Maximum Output Current

RLOAD = 25 Ω RLOAD = 25 Ω RLOAD = 100 Ω RLOAD = 100 Ω

SFDR £ −70 dBc, f = 100 kHz, VOUT = 1.0 VP, RLOAD = 4.3 Ω

0.2 +2.37 +2.42

−2.37 −2.32 +2.45 +2.48

−2.46 −2.42 230

Ω VP VP VP VP mA

POWER SUPPLY

Operating Range (Dual Supply) Supply Current

Power Supply Rejection

∆VS = ±0.5 V

±1.5 ±12.6 7 9 12 −75 −85

V mA/Amp dB

Rev. 0 | Page 4 of 16

AD8397

VS = ±5 V or +10 V (@ TA = 25°C, G = +1, RL = 25 Ω, unless otherwise noted).

Table 3.

Parameter

Test Conditions/Comments

Min Typ Max

Unit

DYNAMIC PERFORMANCE −3 dB Bandwidth

0.1 dB Flatness

Large Signal Bandwidth Slew Rate

VOUT = 0.1 V p-p VOUT = 0.1 V p-p VOUT = 2.0 V p-p VOUT = 4.0 V p-p

66 6.5 14 53

MHz MHz MHz V/µs

NOISE/DISTORTION PERFORMANCE Distortion (Worst Harmonic) Input Voltage Noise

Input Current Noise

fC = 100 kHz, VOUT = 6 V p-p, G = +2 f = 100 kHz

f = 100 kHz

−94 4.5 1.5

dBc nV/ÖHz pA/ÖHz

DC PERFORMANCE Input Offset Voltage

Input Offset Voltage Match Input Bias Current

Input Offset Current Open-Loop Gain

TMIN − TMAX

TMIN − TMAX

VOUT = ±2.0 V

1.0 2.5 2.5

1.0 2.0 200 900 1.3

50 300 85 94

mV mV mV nA µA nA dB

INPUT CHARACTERISTICS Input Resistance

Input Capacitance Common-Mode Rejection

f = 100 kHz

∆VCM = ±1 V

87 1.4

−84 −94

kΩ pF dB

OUTPUTCHARACTERISTICS Output Resistance +Swing

−Swing +Swing −Swing

Maximum Output Current

RLOAD = 25 Ω RLOAD = 25 Ω RLOAD = 100 Ω RLOAD = 100 Ω

SFDR £ −80 dBc, f = 100 kHz, VOUT = 3 VP, RLOAD = 12 Ω

0.2 +4.7 +4.82

−4.74 −4.65 +4.92 +4.96

−4.92 −4.88 250

Ω VP VP VP VP mA

POWER SUPPLY

Operating Range (Dual Supply) Supply Current

Power Supply Rejection

∆VS = ±0.5 V

±1.5 ±12.6 7 9 12 −76 −85

V mA/Amp dB

Rev. 0 | Page 5 of 16

AD8397

VS = ±12 V or +24 V (@ TA = 25°C, G = +1, RL = 25 Ω, unless otherwise noted).

Table 4.

Parameter

Test Conditions/Comments

Min Typ Max

Unit

DYNAMIC PERFORMANCE −3 dB Bandwidth

0.1 dB Flatness

Large Signal Bandwidth Slew Rate

VOUT = 0.1 V p-p VOUT = 0.1 V p-p VOUT = 2.0 V p-p VOUT = 4.0 V p-p

69 7.6 14 53

MHz MHz MHz V/µs

NOISE/DISTORTION PERFORMANCE Distortion (Worst Harmonic) Input Voltage Noise

Input Current Noise

fC = 100 kHz, VOUT = 20 V p-p, G = +5 f = 100 kHz

f = 100 kHz

−84 4.5 1.5

dBc nV/ÖHz pA/ÖHz

DC PERFORMANCE Input Offset Voltage

Input Offset Voltage Match Input Bias Current

Input Offset Current Open-Loop Gain

TMIN − TMAX

TMIN − TMAX

VOUT = 3.0 V

1.0 3.0 2.5

1.0 2.0 200 900 1.3

50 300 90 96

mV mV mV nA µA nA dB

INPUT CHARACTERISTICS Input Resistance

Input Capacitance Common-Mode Rejection

f = 100 kHz

∆VCM = ±1 V

87 1.4

−85 −96

kΩ pF dB

OUTPUTCHARACTERISTICS Output Resistance +Swing

−Swing

Maximum Output Current

RLOAD = 100 Ω RLOAD = 100 Ω

SFDR £ −80 dBc, f = 100 kHz, VOUT = 10 VP, RLOAD = 32 Ω

0.2 +11.82 +11.89

−11.83 −11.77 310

Ω VP VP mA

POWER SUPPLY

Operating Range (Dual Supply) Supply Current

Power Supply Rejection

∆VS = ±0.5 V

±1.5 ±12.6 8.5 11 15 −76 −86

V mA/Amp dB

Rev. 0 | Page 6 of 16

05069-020

AD8397

ABSOLUTE MAXIMUM RATINGS

Table 5.

Parameter

Rating

Supply Voltage Power Dissipation1 Storage Temperature

Operating Temperature Range

Lead Temperature Range (Soldering 10 sec)

Junction Temperature

26.4 V

See Figure 4 −65°C to +125°C −40°C to +85°C 300°C

150°C

Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device.This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sec-tion of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect

device reliability.

MAXIMUM POWER DISSIPATION

The maximum power that can be dissipated safely by the AD8397 is limited by the associated rise in junction

temperature. The maximum safe junction temperature for plastic encapsulated devices is determined by the glass transition temperature of the plastic, approximately 150°C. Temporarily exceeding this limit may cause a shift in parametric performance due to a change in the stresses exerted on the die by the package.

4.5

TJ = 150C 4.0

3.5

8-LEAD SOIC EPAD

3.0

2.5

2.0

MAXIMUM POWER DISSIPATION (W)

1.5

J

1 Thermal resistance for standard JEDEC 4-layer board: 8-lead SOIC:qA = 157.6°C/W

J

8-LeadSOIC EPAD: qA = 47.2°C/W

8-LEAD SOIC 1.0

0.5

0

40 –30 20 –10 0 10 20 30 40 50 60 70 80 90 AMBIENT TEMPERATURE (C)

Figure 4. Maximum Power Dissipationvs. Temperature

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate

on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy elec-trostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.

Rev. 0 | Page 7 of 16

AD8397

TYPICAL PERFORMANCE CHARACTERISTICS

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