dsd11-12 / dsd-12=Проектирование РЧ КМОП ИС / papers / 96_Voltage-Comparator-Based_Measurement_Correction

Correction to ªVoltage-Comparator-Based Measurement of Equivalently Sampled Substrate Noise

Waveforms in Mixed-Signal Integrated Circuitsº

Keiko Makie-Fukuda, Takanobu Anbo, Toshiro Tsukada,

Tatsuji Matsuura, and Masao Hotta

The following items were omitted from the above paper1 when it was printed. The italicized line from the Conclusion was omitted as was the end of the Reference section. They are reprinted below in their entirety.

VII. CONCLUSION

metastability during synchronized operation are used to reconstruct the noise waveforms. The waveforms both in the auto-zero and compare modes were experimentally reconstructed to within 0.5-ns accuracy. Analysis using the circuit simulation proved that the noise in the auto-zero mode is almost exclusively detected at the backgate of the first stage inverter. By measuring the noise in the auto-zero mode, the substrate noise waveform can be reconstructed with high resolution and wide bandwidth. The measured and simulated results can be used to design the analog circuits with high noise tolerance. This method makes it possible to observe the influence of substrate noise on actual on-chip analog circuits such as the A/D converters.

REFERENCES

Noise waveforms were measured by using a proposed voltage- comparator-based noise measurement method that uses on-chip single-ended chopper-type voltage comparators as noise detectors. Since the comparator is a high gain amplifier and its output are digital values, noise is detected with high resolution and noise waveform can be easily reconstructed by digital signal processing. The average voltages calculated from the probability distribution of comparator

Manuscript received May 23, 1995.

K. Makie-Fukuda, T. Tsukada, T. Matsuura, and M. Hotta are with the Semiconductor Development Cetner, Semiconductor and Integrated Circuits Division, Hitachi, Ltd., Tokyo, Japan.

T. Anbo is with Hitachi ULSI Engineering Corporation, Tokyo, Japan. Publisher Item Identifier S 0018-9200(96)06692-9.

1 K. Makie-Fukuda, T. Anbo, T. Tsukada, T. Matsuura, and M. Hotta, IEEE

J.Solid-State Circuits, vol. 31, no. 5, pp. 726±731.

[1]M. J. Loinaz et al., ªExperimental results and modeling techniques for switching noise in mixed-signal integrated circuits,º VLSI Circuit Symp. Dig., pp. 40±41, 1992.

[2]S. Masui, ªSimulation of substrate coupling in mixed-signal MOS circuits,º VLSI Circuit Symp. Dig., pp. 42±43, 1992.

[3]D. K. Su, M. J. Loinaz, S. Masui, and B. A. Wooley, ªExperimental results and modeling techniques for substrate noise in mixed-signal integrated circuits,º IEEE J. Solid-State Circuits, vol. 28, no. 4, pp. 420±430, Apr. 1993.

[4]K. Makie-Fukuda et al., ªMeasurement of digital noise in mixed-signal integrated circuits,º VLSI Circuit Symp. Dig., pp. 23±24, 1993.

[5]K. Makie-Fukuda, T. Kikuchi, M. Hotta, and T. Matsuura, ªMeasurement of digital noise in mixed-signal integrated circuits,º IEEE J. Solid-State Circuits, vol. 30, no. 2, pp. 87±92, Feb. 1995.

[6]T. Tsukada et al., ªHigh-speed measuring system for testing mixed- signal-LSI performance and its application to digital-noise measurement,º in IEEE Measurement and Test Conf. Proc., THPM3-5, 1994, pp. 1294±1299.