Сканирующая зондовая микроскопия диссертация

474.C.Y.Nakakura, P.Tangyunyong, D.L.Hetherington, M.R.Shaneyfelt, Method for the study of semiconductor device operation using scanning capacitance microscopy, Rev.Sci.Instrum. 74(2003)127-133

475.E.Bussmann, C.C.Williams, Sub-10nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes, Rev.Sci.Instrum. 75(2004)422-425

476.D.T.Lee, J.P.Pelz, B.Brushan, Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance, Rev.Sci.Instrum. 73(2002)3525-3533

477.S.Lanyi, J.Torok, P.Rehurek, Imaging conducting surfaces and dielectric films by a scanning capacitance microscope, J.Vac.Sci.Technol.B 14(1996)892-896

478.K.Goto, K.Hane, Tip-Sample capacitance in capacitance microscopy of dielectric films, J.Appl.Phys. 84(1998)4043-4048

479.E.S.Kang, J.W.Kang, H.J.Hwang, J.H.Lee, Nondestructive one-dimensional scanning capacitance microscope dopant profile determination method and its application to three-dimensional dopant profiles, J.Vac.Sci.Technol.A 18(2000)1338-1344

480.S.Lanyi, Assessment of sensitivity and resolution limits of scanning capacitance microscopes, Acta Physica Slovaca 52(2002)55-64

481.H.E.Ruda, A.Shik, Theoretical analysis of scanning capacitance microscopy, Phys.Rev.B 67(2003)235309-1-235309-7

482.N.Nakagiri, T.Yamamoto, H.Sugimura, Y.Suzuki, Imaging mechanism and effects of adsorbed water in contact-type scanning capacitance microscopy, J.Vac.Sci.Technol.B 14(1996)887-891

483.T.Tran, D.R.Oliver, D.J.Thomson, G.E.Bridges, "Zeptofarad" (10-21 F) resolution capacitance sensor for scanning capacitance microscopy, Rev.Sci.Instrum. 72(2001)26182623

484.J.Schmidt, D.H.Rapoport, G.Behme, H.J.Frohlich, Microwave-mixing scanning capacitance microscopy of pn junction, J.Appl.Phys. 86(1999)7094-7099

485.B.J.Rodriguez, S.Jesse, V.Meunier, S.V.Kalinin, Scanning frequency mixing microscopy of high-frequency transport behavior at electroactive interfaces, Appl.Phys.Lett. 88(2006)143128-1-143128-3

486.L.S.C.Pingree, M.C.Hersam, Bridge-enhanced nanoscale impedance microscopy, Appl.Phys.Lett. 87(2005)233117-1-233117-3

487.L.Fumagalli, G.Ferrari, M.Sampietro, I.Casuso, E.Martinez, J.Samitier, G.Gomila, Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy, Nanotechnology 17(2006)4581-4587

391

488.O.Schneegans, P.Chretien, F.Houze, R.Meyer, Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy, Appl.Phys.Lett. 90(2007)043116-1043116-3

489.L.S.C.Pingree, E.F.Martin, K.R.Shull, M.C.Hersam, Nanoscale impedance microscopy - a characterization tool for nanoelectronic devices and circuits, IEEE Transactions on Nanotechnology 4(2005)255-259

490.K.Darowicki, A.Zielinski, K.J.Kurzydlowski, Application of dynamic impedance spectroscopy to atomic force microscopy, Sci.Technol.Adv.Mater. 9(2008)045006-1- 045006-5

491.A.Guadarrama-Santana, A.Garcia-Valenzuela, Determination of the dielectric constant of coatings with a capacitance probe, Proceedings of SPIE 6422(2007)64221N-1- 64221N-9

492.L.Fumagalli, G.Ferrari, M.Sampietro, G.Gomila, Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy, Appl.Phys.Lett. 91(2007)243110-1-243110-3

493.G.Gomila, J.Toset, L.Fumagalli, Nanoscale capacitance microscopy of thin dielectric films, J.Appl.Phys. 104(2008)024315-1-024315-8

494.H.Yamamoto, T.Takahashi, I.Kamiya, Local capacitance measurements on InAs dotcovered GaAs surfaces by scanning capacitance microscopy, Appl.Phys.Lett. 77(2000)1994-1996

495.W.Brezna, T.Roch, G.Strasser, J.Smoliner, Quantitative scanning capacitance spectroscopy on GaAs and InAs quantum dots, Semicond.Sci.Technol. 20(2005)903-907

496.I.Casuso, L.Fumagalli, G.Gomila, Nondestructive thickness measurement of biological layers at the nanoscale by simultaneous topography and capacitance imaging, Appl.Phys.Lett. 91(2007)063111-1-063111-3

497.R.Shao, S.V.Kalinin, D.A.Bonnell, Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy, Appl.Phys.Lett. 82(2003)18691871

498.X.D.Ding, G.Fu, X.M.Xiong, J.X.Zhang, Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy, Chin.Phys.Lett. 25(2008)35973600

499.R.O’Hayre, M.Lee. F.B.Prinz, Ionic and electronic impedance imaging using atomic force microscopy, J.Appl.Phys. 95(2004)8382-8392

500.A.Layson, S.Gadad, D.Teeters, Resistance measurements at the nanoscale: scanning probe AC impedance spectroscopy, Electrochim.Acta 48(2003)2207-2213

392

501.A.R.Layson, D.Teeters, Polymer electrolytes confined in nanopores: using water as a means to explore the interfacial impedance at the nanoscale, Solid State Ionics 175(2004)773-780

502.A.J.Bhattacharyya, J.Fleig, Y.G.Guo, J.Maier, Local Conductivity Effects in Polymer Electrolytes, Adv.Mater. 17(2005)2630-2634

503.R.I.MacCuspie, N.Nuraje, S.Y.Lee, A.Runge, H.Matsui, Comparison of Electrical Properties of Viruses Studied by AC Capacitance Scanning Probe Microscopy, J.Am.Chem.Soc. 130(2008)887-891

504.R.O’Hayre, G.Feng, W.D.Nix, F.B.Prinz, Quantitative impedance measurements using atomic force microscopy, J.Appl.Phys. 96(2004)3540-3549

505.K.Eckhard, C.Kranz, H.Shin, B.Mizaikoff, W.Schuhmann, Frequency dependence of the electrochemical activity contrast in AC-scanning electrochemical microscopy and atomic force microscopy-AC-scanning electrochemical microscopy imaging, Anal.Chem. 79(2007)5435-5438

506.K.Eckhard, H.Shin, B.Mizaikov, W.Schuhmann, C.Kranz, Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM) Electrochem.Comm. 9(2007)1311-1315

507.M.Fujihira, Kelvin probe force microscopy of molecular surfaces, Annu.Rev.Mater.Sci. 29(1999)353-380

508.Y.Martin, D.W.Abraham, H.K.Wickramasinghe, High-resolution capacitance measurement and potentiometry by force microscopy, Appl.Phys.Lett. 52(1988)1103-1105

509.B.D.Terris, J.E.Stern, D.Rugar, H.J.Mamin, Contact Electrification Using Force Microscopy, Phys.Rev.Lett. 63(1989)2669-2672

510.C.H.Lei, A.Das, M.Elliott, J.E.Macdonald, Quantitative electrostatic force microscopyphase measurements, Nanotechnology 15(2004)627-634

511.A.Gil, J.Colchero, J.Gomez-Herrero, A.M.Baro, Electrostatic force gradient signal: resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy, Nanotechnology 14(2003)332-340

512.E.Tevaarwerk, D.G.Keppel, P.Rugheimer, M.G.Lagally, M.A.Eriksson, Quantitative analysis of electric force microscopy: The role of sample geometry, Rev.Sci. Instrum. 76(2005)053707-1-053707-5

513.S.Belaidi, P.Girard, G.Leveque, Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions, J.Appl.Phys.81(1997)1023-1030

393

514.F.R.Zypman, S.J.Eppell, Electrostatic tip-surface interaction in scanning force microscopy: A convenient expression useful for arbitrary tip and sample geometries, J.Vac.Sci.Technol.B 15(1997)1853-1860

515.Z.Y.Li, B.Y.Gu, G.Z.Yang, Scanning-electrostatic-force microscopy: Self-consistent method for mesoscopic surface structures, Phys.Rev.B. 57(1998)9225-9233

516.S.Cunningham, I.A.Larkin, J.H.Davis, Noncontact scanning probe microscope potentiometry of surface charge patches: Origin and interpretation of time-dependent signals, Appl.Phys.Lett. 73(1998)123-125

517.S.Gomez-Monivas, J.J.Saenz, R.Carminati, J.J.Greffet, Theory of electrostatic probe microscopy: A simple perturbative approach, Appl.Phys.Lett. 76(2000)2955-2957

518.S.Gomez-Monivas, L.S.Froufe-Perez, A.J.Caamano, J.J.Saenz, Electrostatic forces between sharp tips and metallic and dielectric samples, Appl.Phys.Lett. 79(2001)40484050

519.E.Strassburg, A.Boag, Y.Rosenwanks, Reconstruction of electrostatic force microscopy images, Rev.Sci.Instrum. 76(2005)083705-1-083705-5

520.G.M.Sacha, A.Verdaguer, J.Martinez, J.J.Saenz, D.F.Ogletree, M.Salmeron, Effective tip radius in electrostatic force microscopy, Appl.Phys.Lett. 86(2005)123101-1-123101-3

521.S.Gomez-Monivas, L.S.Froufe, R.Carminati, J.J.Greffet, J.J.Saenz, Tip-shape effects on electrostatic force microscopy resolution, Nanotechnology 12(2001)496-499

522.P.M.Bridger, Z.Z.Bandic, E.C.Piquette, T.C.McGill, Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy, Appl.Phys.Lett. 74(1999)3522-3524

523.P.Girard, P.Cadet, M.Ramonda, N.Shmidt, A.N.Usikov, W.V.Lundin, M.S.Dunaevskii, A.N.Titkov, Atomic and electrostatic force microscopy observations on gallium nitride, Phys. Status Solidi A 195(2003)508-515

524.А.В.Анкудинов, А.Н.Титков, R.Laiho, В.А.Козлов, Исследование распределений потенциала в прямо смещенном кремниевом диоде методом электростатической силовой микроскопии, Физика и техника полупроводников 36(2002)1138-1143

525.A.Ankudinov, V.Marushchak, A.Titkov, V.Evtikhiev, E.Kotelnikov, A.Egorov, H.Riechert, H.Huhtinen, R Laiho, Fine structure of the inner electric field in semiconductor laser diodes studied by EFM, Phys. Low-Dimens. Struct. 3-4(2001)9-16

526.А.В.Анкудинов, Е.Ю.Котельников, А.А.Канцельсон, В.П.Евтихиев, А.Н.Титков, Микроскопия электростатических сил на сколах полупроводниковых лазерных диодов, Физика и техника полупроводников 35(2001)874-880

394

527.E.Bussmann, D.J.Kim, C.C.Williams, Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy, Appl.Phys.Lett. 85(2004)2538-2540

528.М.С.Дунаевский, А.Н.Титков, С.Ю.Ларкин, А.Б.Спешилова, С.Е.Александров, С.Bonafos, A.Claverie, R Laiho, Нанолокальная зарядовая запись в тонких слоях SiO2 с встроенными Si нанокристаллами под зондом атомно-силового микроско-

па, Письма ЖТФ 33(2007)80-87

529.S.V.Kalinin, D.A.Bonnell, Local potential and polarization screening on ferroelectric surfaces, Phys.Rev.B 63(2001)125411-1-125411-13

530.А.В.Анкудинов, А.Н.Титков, Атомно-силовая микроскопия поляризационных доменов в сегнетоэлектрических пленках, Физика и техника полупроводников

47(2005)1110-1117

531.A.Bachtold, M.S.Fuhrer, S.Plyasunov, M.Forero, E.H.Anderson, A.Zettl, P.L.McEuen, Scanned Probe Microscopy of Electronic Transport in Carbon Nanotubes, Phys.Rev.Lett. 84(2000)6082-6085

532.S.Kalinin, D.A.Bonnell, M.Freitag, A.T.Johnson, Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies, Appl.Phys.Lett. 81(2002)754756

533.E.Palacios-Lidon, J.Abellan, J.Colchero, C.Munuera, C.Ocal, Quantitative electrostatic force microscopy on heterogeneous nanoscale samples, Appl.Phys.Lett. 87(2005)154106-1-154106-3

534.M.Bockrath, N.Markovic, A.Shepard, M.Tinkham, L.Gurevich, L.P.Kouwenhoven, M.W.Wu, L.L.Sohn, Scanned Conductance Microscopy of Carbon Nanotubes and g- DNA, Nanolett. 2(2002)187-190

535.Y.Zhou, M.Freitag, J,Hone, C.Staii, A.T.Johnson Jr., N.J.Pinto, A.G.MacDiarmid, Fabrication and electrical characterization of polyaniline-based nanofibers with diameter below 30 nm, Appl.Phys.Lett. 83(2003)3800-3802

536.C.Staii, A.T.Johnson Jr., N.J.Pinto, Quantitative Analysis of Scanning Conductance Microscopy, Nanolett. 4(2004)859-862

537.J.Hu, X.D.Xiao, M.Salmeron, Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers, Appl.Phys.Lett. 67(1995)476-478

538.M.Salmeron, Scanning Polarization Force Microscopy. A Technique for Studies of Wetting Phenomena at the Nanometer Scale, Oil & Gas Science and Technology, 56(2001)63-75

395

539.X.Li, J.Sun, X.Zhou, G.Li, P.He, Y.Fang, M.Li, J.Hu, Height measurement of dsDNA and antibodies adsorbed on solid substrates in air by vibrating mode scanning polarization force microscopy, J.Vac.Sci.Technol.B 21(2003)1070-1073

540.Y.Chen, X.Li, X.Zhou, J.Sun, W.Huang, J.Hu, Analysis of vibrating mode scanning polarization force microscope, Rev.Sci.Instrum. 75(2004)4721-4746

541.M.Fujihira, H.Kawate, M.Yasutake, Scanning Surface Potential Microscopy for Local Surface Analysis, Chemistry Lett. (1992)2223-2226

542.S.Kitamura, M.Iwatsuki, High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope, Appl.Phys.Lett. 72(1998)31543156

543.Ch.Sommerhalter, Th.W.Matthes, Th.Glatzel, A.Jager-Waldau, M.Ch.Lux-Steiner, High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy, Appl.Phys.Lett. 75(1999)286-288

544.U.Zerweck, C.Loppacher, T.Otto, S.Grafstrom, L.M.Eng, Accuracy and resolution limits of Kelvin probe force microscopy, Phys.Rev.B 71(2005)125424-1-125424-9

545.T.Fukuma, K.Kobayashi, H.Yamada, K.Matsushige, Surface potential measurements by the dissipative force modulation method, Rev.Sci.Instrum. 75(2004)4589-4594

546.M.Nonnemacher, M.P.O'Boyle, H.K.Wickramasinghe, Kelvin probe force microscopy, Appl.Phys.Lett. 58(1991)2921-2923

547.J.M.Palau, J.Bonnet, Design and perfomance of a Kelvin probe for the study of topographic work functions, J.Phys.E 21(1988)674-679

548.H.O.Jacobs, H.F.Knapp, S.Muller, A.Stemmer, Surface potential mapping: A qualitative material contrast in SPM, Ultramicroscopy 69(1997)39-49

549.H.O.Jacobs, P.Leuchtmann, O.J.Homan, A.Stemmer, Resolution and contrast in Kelvin probe force microscopy, J.Appl.Phys. 84(1998)1168-1173

550.H.O.Jacobs, H.F.Knapp, A.Stemmer, Practical aspects of Kelvin probe force microscopy, Rev.Sci.Instrum. 70(1999)1756-1760

551.O.Vatel, M.Tanimoto, Kelvin probe force microscopy for potential distribution measurement of semiconductor devices, J.Appl.Phys. 77(1995)2358-2362

552.A.Efimov, S.R.Cohen, Simulation and correction of geometric distortions in scanning Kelvin probe microscopy, J.Vac.Sci.Technol.A 18(2000)1051-1055

553.T.Takahashi, S.Ono, Tip-to-sample distance dependence of an electrostatic force in KFM measurements, Ultramicroscopy, 100(2004)287-292

396

554.Y.Wu, M.A.Shannon, ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction, Rev.Sci.Instrum. 77(2006)043711-1-043711-9

555.O.A.Semenikhin, L.Jiang, T.Iyoda, K.Hashimoto, A.Fujishima, Atomic Force Microscopy and Kelvin Probe Force Microscopy Evidence of Local Structural Inhomogeneity and Nonuniform Dopant Distribution in Conducting Polybithiophene, J.Phys.Chem. 100(1996)18603-18606

556.O.A.Semenikhin, L.Jiang, T.Iyoda, K.Hashimoto, A.Fujishima, A Kelvin probe force microscopic study of the local dopant distribution in conducting polybithiophene, Electrochim.Acta 42(1997)3321-3326

557.N.Nakagiri, H.Sugimura, Y.Ishida, K.Hayashi, O.Takai, Effects of an adsorbed water layer and self-assembled organosilane monolayers on scanning probe microscopy of silicon pn structures, Surf.Sci. 532-535(2003)999-1003

558.B.S.Simpkins, E.T.Yu, P.Waltereit, J.S.Speck, Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride, J.Appl.Phys. 94(2003)1448-1453

559.H.Ishii, N.Hayashi, E.Ito, Y.Washizu, K.Sugi, Y.Kimura, M.Niwano, Y.Ouchi, K.Seki, Kelvin probe study of band bending at organic semiconductor/metal interfaces: examination of Fermi level alignment, Phys.Stat.Sol.(a) 201(2004)1075-1094

560.R.Bozek, K.Pakula, J.M.Baranowski, Light induced contrast in Kelvin Force Microscopy of GaN epilayers, Phys.Stat.Sol.(c) 1(2004)364-367

561.A.Doukkali, S.Ledain, C.Guasch, J.Bonnet, Surface potential mapping on biased pn junction with kelvin probe force microscopy: application to cross-section devices, Appl.Surf.Sci. 235(2004)507-512

562.К.С.Ладутенко, А.В.Анкудинов, В.П.Евтихиев, Прямое наблюдение утечек неосновных носителей заряда в действующем лазерном диоде методом сканирующей Кельвин-зонд-микроскопии, Письма ЖТФ 35(2009)74-80

563.A.V.Ankudinov, V.P.Evtikhiev, K.S.Ladutenko, M.G.Rastegaeva, A.N.Titkov, R.Laiho, Kelvin probe force and surface photovoltage microscopy observation of minority holes leaked from active region of working InGaAs/AlGaAs/GaAs laser diode, J. Appl. Phys. 101(2007)024504-1-024504-8

564.А.В.Анкудинов, В.П.Евтихиев, К.С.Ладутенко, А.Н.Титков, R.Laiho, Сканирующая кельвин-зонд-микроскопия утечки дырок из активной области работающего инжекционного полупроводникового лазерного диода, Физика и техника полу-

проводников 40(2006)1009-1016

397

565.A.V.Ankudinov, V.P.Evtikhiev, E.Y.Kotelnikov, A.N.Titkov, R.Laiho, Voltage distributions and nonoptical catastrophic mirror degradation in high power InGaAs/AlGaAs/GaAs lasers studied by Kelvin probe force microscopy, J. Appl. Phys. 93(2003)432-437

566.M.Fujihira, H.Kawate, Scanning surface potential microscope for characterization of Langmuir-Blodgett films, Thin Solid Films, 242(1994)163-169

567.M.Pfeiffer, K.Leo, N.Karl, Fermi level determination in organic thin films by the Kelvin probe method, J.Appl.Phys. 80(1996)6880-6883

568.J.Lu, E.Delamarche, L.Eng, R.Bennewitz, E.Meyer, H.J.Guntherodt, Kelvin Probe Force Microscopy on Surfaces: Investigation of the Surface Potential of Self-Assembled Monolayers on Gold, Langmuir, 15(1999)8184-8188

569.K.P.Puntambekar, P.V.Pesavento, C.D.Frisbie, Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy, Appl.Phys.Lett. 83(2003)5539-5541

570.V.Palermo, S.Morelli, M.Palma, C.Simpson, F.Nolde, A.Herrmann, K.Mullen, P.Samori, Nanoscale Structural and Electronic Properties of Ultrathin Blends of Two Polyaromatic Molecules: A Kelvin Probe Force Microscopy Investigation, Chem.Phys.Chem. 7(2006)847-853

571.J.N.Barisci, R.Stella, G.M.Spinks, G.G.Wallace, Study of the surface potential and photovoltage of conducting polymers using electric force microscopy, Synthetic Metals 124(2001)407-414

572.J.N.Barisci, R.Stella, G.M.Spinks, G.G.Wallace, Characterization of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies, Electrochim.Acta 46(2000)519-531

573.B.Ф. Иванов, О. Л. Грибкова, А. В. Ванников, Регулирование в широких пределах проводимости полианилина при межфазном допировании полианилинового слоя,

Электрохимия 42(2006)304-309

574.V.F.Ivanov, O.L.Gribkova, S.V.Novikov, A.A.Nekrasov, A.A.Isakova, A.V.Vannikov, G.B.Meshkov, I.V.Yaminsky, Redox heterogeneity in polyaniline films: From molecular to macroscopic scale, Synthetic Metals 152(2005)153-156

575.S.V.Kalinin, D.A.Bonnell, Scanning impedance microscopy of electroactive interfaces, Appl.Phys.Lett. 78(2001)1306-1308

576.S.V.Kalinin, D.A.Bonnell, Scanning impedance microscopy of an active Schottky barrier diode, J.Appl.Phys. 91(2002)832-839

398

577.S.V.Kalinin, D.A.Bonnell, Local electronic transport at grain boundaries in Nb-doped SrTiO3, Phys.Rev.B 70(2004)235304-1-235304-10

578.J.Shih, V.Meunier, A.P.Baddorf, S.V.Kalinin, Nonlinear transport imaging by scanning impedance microscopy, Appl.Phys.Lett. 85(2004)4240-4242

579.C.W.Lin, F.R.F.Fan, A.J.Bard, High Resolution Photoelectrochemical Etching of n- GaAs with the Scanning Electrochemical and Tunneling Microscope, J.Electrochem.Soc. 134(1987)1038-1039

580.D.H.Craston, C.W.Lin, A.J.Bard, High Resolution Deposition of Silver in Nafion Films with the Scanning Tunneling Microscope, J.Electrochem.Soc. 135(1988)785-786

581.O.E.Husser, D.H.Craston, A.J.Bard, Scanning Electrochemical Microscopy, HighResolution Deposition and Etching of Metals, J.Electrochem.Soc. 136(1989)3222-3229

582.S.E.Pust, W.Maier, G.Wittstock, Investigation of Localized Catalytic and Electrocatalytic Processes and Corrosion Reactions with Scanning Electrochemical Microscopy (SECM), Z.Phys.Chem. 222(2008)1463-1517

583.K.Eckhard, W.Schuhmann, Alternating current techniques in scanning electrochemical microscopy (AC-SECM), Analyst 133(2008)1486-1497

584.W.S.Roberts, D.J.Lonsdale, J.Griffiths, S.P.J.Higson, Advances in the application of scanning electrochemical microscopy to bioanalytical systems, Biosensors and Bioelectronics 23(2007)301-318

585.X.Lu, Q.Wang, X.Liu, Review: Recent applications of scanning electrochemical microscopy to the study of charge transfer kinetics, Analytica Chimica Acta 601(2007)10-25

586.A.L.Whitworth, D.Mandler, P.R.Unwin, Theory of scanning electrochemical microscopy (SECM) as a probe of surface conductivity, Phys.Chem.Chem.Phys. 7(2005)356-365

587.G.Nagy, L.Nagy, Scanning electrochemical microscopy: a new way of making electrochemical experiments, Fresenius J.Anal.Chem. 366(2000)735-744

588.A.J.Bard, F.R.F.Fan, Electrochemical Detection of Single Molecules, Acc.Chem.Res. 29(1996)572-578

589.F.R.F.Fan, J.Kwak, A.J.Bard, Single Molecule Electrochemistry, J.Am.Chem.Soc. 118(1996)9669-9675

590.J.Meier, K.A.Friedrich, U.Stimming, Novel method for the investigation of single nanoparticle reactivity, Faradey Discuss. 121(2002)365-372

591.J.V.Macpherson, J.P.Gueneau de Mussy, J.L.Delplancke, High-Resolution Electrochemical, Electrical, and Structural Characterization, of a Dimensionally Stable Ti/TiO2/Pt Electrode, J.Electrochem.Soc. 149(2002)B306-B313

399

592.Г.К.Будников, Н.А.Улахович, Э.П.Медянцева, Основы электроаналитической химии. Издательство Казанского университета, 1986 г., 288 с.

593.S.M.Sze, Kwok K.Ng, Physics of Semiconductor Devices, Wiley, 2007, 763p

594.G.Binnig, H.Fuchs, Ch.Gerber, H.Rohrer, E.Stoll, E.Tosatti, Energy-Dependent StateDensity Corrugation of a Graphite Surface as Seen by Scanning Tunneling Microscopy, Europhys.Lett. 1(1986)31-36

595.J.E.Griffith, D.A.Grigg, Dimensional metrology with scanning probe microscopes, J.Appl.Phys. 74(1993)R83-R109

596.K.F.Jarausch, T.J.Stark, P.E.Russell, Silicon structures for in situ characterization of atomic force microscope probe geometry, J.Vac.Sci.Technol.B 14(1996)3425-3430

597.H.Itoh, T.Fujimoto, S.Ichimura, Tip characterizer for atomic force microscopy, Review of Scientific Instruments, 77(2006)103704-1-103704-4

598.S.Heike, T.Hashizume, Y.Wada, In situ control and analysis of the scanning tunneling microscope tip by formation of sharp needles on the Si sample and W tip, J.Vac.Sci.Technol.B 14(1996)1522-1526

599.M.Sumetskii, A.A.Kornyshev, U.Stimming, The shape of a nanoprobe determined by imaging spherical clusters, Appl.Phys.Lett. 68(1996)2436-2438

600.A.W.Marczewski, K.Higashitani, Modeling and analysis of experimental atomic force microscope images of hard colloidal particles, Computers Chem. 21(1997)129-142

601.K.A.Ramirez-Aguilar, K.L.Rowlen, Tip Characterization from AFM Images of Nanometric Spherical Particles, Langmuir 14(1998)2562-2566

602.J.A.Derose, J.P.Revel, A comparative study of colloidal particles as imaging standards for microscopy, Journal of Microscopy, 195(1999)64-78

603.J.W.Carlson, B.J.Godfrey, S.G.Sligar, Metal Binding Colloidal Gold Particles: A Versalite Scanning Force Microscope Tip Calibrator for Fluid Imaging, Langmuir 15(1999)3086-3090

604.F.Mizuno, I.Misumi, S.Gonda, T.Kurosawa, Impacts of probe-tip tilt on scanning probe microscopy, J.Vac.Sci.Technol.B 22(2004)3394-3398

605.J.S.Villarrubia, Algoritms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation, J.Res.Natl. Stand. Technol. 102(1997)425-454

606.D.J.Keller, F.S.Franke, Envelope reconstruction of probe microscopy images, Surf.Sci. 294(1993)409-419

607.J.S.Villarrubia, Morphological estimation of tip geometry for scanned probe microscopy, Surf.Sci. 321(1994)287-300

400