
- •Метод конечных элементов.
- •Построение сетки конечных элементов
- •Создание нового макроса
- •Добавление аргументов
- •Добавление шагов процесса к макросу
- •Вставка макросов в процесс
- •Лабораторная работа № 1 "Составление описания технологического процесса формирования кмоп-инвертора"
- •Порядок выполнения работы:
- •Приложение 1. Код командного файла
- •Лабораторная работа № 2 "Составление описания технологического процесса формирования биполярного транзистора"
- •Порядок выполнения работы:
- •Формирование эпитаксиального слоя.
- •Формирование контакта к заглубленному слою.
- •Формирование базовой области транзистора.
- •Формирование эмиттерной области транзистора.
- •Формирование металлической разводки.
Приложение 1. Код командного файла
set sim_left 0
set sim_right 30
set sim_bottom 5
set sim_top 0
## -----------------------------------##
## -------- LIGAMENT OUTPUT --------##
## -----------------------------------##
## ------- user defined grid ---------##
## -----------------------------------##
line x location=0.0 spacing=10<nm> tag=SiTop
line x location=3.0 spacing=100<nm>
line x location=6.0 spacing=500<nm> tag=SiBottom
line y location=0.0 spacing=1 tag=SiLeft
line y location=30.0 spacing=1 tag=SiRight
region silicon xlo=SiTop xhi=SiBottom ylo=SiLeft yhi=SiRight
init concentration=2e16 field=Boron wafer.orient=100 slice.angle=[CutLine2D 0 0 30 0.0]
mgoals on min.normal.size=3<nm> max.lateral.size=1<um> normal.growth.ratio=1.4
graphics on
## ------------------------------------
## ---- Karman -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_2 segments = {-0.1 18.5 25.5 30.1 } negative
photo mask=mask_1_2 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Phosphorus dose=4e12 energy=500 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_2 time=240 temp=1150
diffuse temp_ramp=tempramp_1_2
struct tdr=result_KARMAN
## ------------------------------------
## ---- SIP -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_3 segments = {-0.1 18.25 20.85 23.3 25.75 30.1 } negative
photo mask=mask_1_3 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Boron dose=5e13 energy=50 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_3 time=30 temp=1150
diffuse temp_ramp=tempramp_1_3
struct tdr=result_SIP
## ------------------------------------
## ---- SIN -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_4 segments = {-0.1 3.25 5.75 8.25 10.75 29.85 } negative
photo mask=mask_1_4 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Phosphorus dose=7e13 energy=50 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_4 time=45 temp=1150
diffuse temp_ramp=tempramp_1_4
struct tdr=result_SIN
## ------------------------------------
## ---- Ring -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_5 segments = {2.75 11.25 15.75 30.1 } negative
photo mask=mask_1_5 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Boron dose=1.5e15 energy=200 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_5 time=30 temp=1150
diffuse temp_ramp=tempramp_1_5
struct tdr=result_RING
## ------------------------------------
## ---- Kontakt_N -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_6 segments = {-0.1 3.625 6.375 7.625 10.375 30.1 } negative
photo mask=mask_1_6 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Phosphorus dose=7e14 energy=100 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_6 time=30 temp=1150
diffuse temp_ramp=tempramp_1_6
struct tdr=result_KONTAKT_P
## ------------------------------------
## ---- Kontakt_P -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.2
mask name=mask_1_7 segments = {-0.1 18.625 21.375 22.625 25.375 30.1 } negative
photo mask=mask_1_7 thickness=3
etch material = {Oxide} type=anisotropic rate = {0.21} time=1
implant Boron dose=5e14 energy=90 tilt=7 rot=-90
strip Photoresist
etch material = {Oxide} type=isotropic rate = {0.21} time=1
temp_ramp name=tempramp_1_7 time=10 temp=1150
diffuse temp_ramp=tempramp_1_7
struct tdr=result_KONTAKT_N
## ------------------------------------
## ---- zatvor_oxide_metall -----
## ------------------------------------
deposit material = {Oxide} type = isotropic rate = {1.0} time=0.04
graphics on
struct tdr=oxide_zatvor
deposit material = {Poly} type = isotropic Phosphorus conc=1e19 rate = {1.0} time=0.6
struct tdr=poly
deposit material = {Photoresist} type = isotropic rate = {1.0} time=1
mask name=mask_1_8 segments = {6.2 7.7 21.2 22.7 } negative
photo mask=mask_1_8 thickness=3
etch material = {Poly} type=isotropic rate = {0.6000000000000001} time=1
strip Photoresist
struct tdr=poly_and_oxide
deposit material = {Oxide} type = isotropic rate = {1.0} time=1
mask name=mask_1_9 segments = {-0.1 4.0 5.5 8.5 10.1 19.0 20.5 23.6 25.0 30.1 } negative
photo mask=mask_1_9 thickness=3
etch material = {Oxide} type=isotropic rate = {1.06} time=1
strip Photoresist
struct tdr=oxide
deposit material = {Aluminum} type = isotropic rate = {1.0} time=1
mask name=mask_1_10 segments = {0.1 6.2 7.7 11.0 18.0 21.2 22.7 27.0 } negative
photo mask=mask_1_10 thickness=3
etch material = {Aluminum} type=isotropic rate = {1} time=1
strip Photoresist
struct tdr=RESULT_Me
SetPlxList {BTotal ArsenicTotal}
WritePlx result.plx
struct smesh=n@node@
exit