
- •Distinctive Characteristics
- •General Description
- •S29AL032D Features
- •Table of Contents
- •List of Tables
- •List of Figures
- •1. Product Selector Guide
- •2. Block Diagram
- •3. Connection Diagrams
- •3.1 FBGA Package for Model 00 Only
- •3.2 FBGA Package for Models 03, 04 Only
- •3.3 Special Handling Instructions
- •4. Pin Configuration
- •5. Logic Symbols
- •6. Ordering Information
- •6.1 S29AL032D Standard Products
- •6.2 Valid Combinations
- •7. Device Bus Operations
- •7.1 Word/Byte Configuration (Models 03, 04 Only)
- •7.2 Requirements for Reading Array Data
- •7.3 Writing Commands/Command Sequences
- •7.4 Program and Erase Operation Status
- •7.5 Accelerated Program Operation
- •7.6 Standby Mode
- •7.7 Automatic Sleep Mode
- •7.8 RESET#: Hardware Reset Pin
- •7.9 Output Disable Mode
- •7.10 Sector Addresss Tables
- •7.11 Autoselect Mode
- •7.12 Sector Protection/Unprotection
- •7.14 Temporary Sector Unprotect
- •8. Secured Silicon Sector Flash Memory Region
- •9. Hardware Data Protection
- •9.2 Write Pulse “Glitch” Protection
- •9.3 Logical Inhibit
- •10. Common Flash Memory Interface (CFI)
- •11. Command Definitions
- •11.1 Reading Array Data
- •11.2 Reset Command
- •11.3 Autoselect Command Sequence
- •11.5 Word/Byte Program Command Sequence
- •11.6 Unlock Bypass Command Sequence
- •11.7 Chip Erase Command Sequence
- •11.8 Sector Erase Command Sequence
- •11.9 Erase Suspend/Erase Resume Commands
- •11.10 Command Definitions Table
- •12. Write Operation Status
- •12.1 DQ7: Data# Polling
- •12.2 RY/BY#: Ready/Busy#
- •12.3 DQ6: Toggle Bit I
- •12.4 DQ2: Toggle Bit II
- •12.5 Reading Toggle Bits DQ6/DQ2
- •12.6 DQ5: Exceeded Timing Limits
- •12.7 DQ3: Sector Erase Timer
- •13. Absolute Maximum Ratings
- •14. Operating Ranges
- •15. DC Characteristics
- •15.1 Zero Power Flash
- •16. Test Conditions
- •16.1 Key to Switching Waveforms
- •17. AC Characteristics
- •17.1 Read Operations
- •17.2 Hardware Reset (RESET#)
- •17.3 Word/Byte Configuration (BYTE#) (Models 03, 04 Only)
- •17.4 Erase/Program Operations
- •17.5 Temporary Sector Unprotect
- •17.6 Alternate CE# Controlled Erase/Program Operations
- •18. Erase and Programming Performance
- •19. TSOP and BGA Pin Capacitance
- •20. Physical Dimensions
- •21. Revision History

D a t a S h e e t
18. Erase and Programming Performance
Parameter |
|
Typ (Note 1) |
Max (Note 2) |
Unit |
Comments |
|
|
|
|
|
|
|
|
Sector Erase Time (Note 7) |
|
0.7 |
10 |
s |
Excludes 00h programming |
|
|
|
|
|
|
||
Chip Erase Time (Note 8) |
|
45 |
|
s |
prior to erasure (Note 4) |
|
|
|
|
||||
|
|
|
|
|
|
|
Byte Programming Time |
|
9 |
300 |
µs |
|
|
|
|
|
|
|
|
|
Word Programming Time |
|
11 |
360 |
µs |
|
|
|
|
|
|
|
Excludes system level overhead |
|
Accelerated Byte/Word Programming Time |
7 |
210 |
µs |
|||
(Note 5) |
||||||
|
|
|
|
|
||
Chip Programming Time |
Byte Mode |
36 |
108 |
s |
|
|
(Note 3) |
|
|
|
|
|
|
Word Mode |
24 |
72 |
s |
|
||
|
|
|
|
|
|
Notes
1.Typical program and erase times assume the following conditions: 25°C, VCC = 3.0 V, 100,000 cycles, checkerboard data pattern.
2.Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles.
3.The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed.
4.In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5.System-level overhead is the time required to execute the twoor four-bus-cycle sequence for the program command. See Table 11.2 for further information on command definitions.
6.The device has a minimum erase and program cycle endurance of 100,000 cycles per sector.
7.At extended temperature range (>+85°C), typical erase time is 1.75 s and maximum erase time is 25 s.
8.At extended temperature range (>+85°C), typical erase time is 112 s.
19. TSOP and BGA Pin Capacitance
Parameter Symbol |
Parameter Description |
Test Setup |
Package |
Typ |
Max |
Unit |
|
|
|
|
|
|
|
|
|
CIN |
Input Capacitance |
VIN = 0 |
TSOP |
6 |
7.5 |
pF |
|
|
|
|
|
||||
BGA |
4.2 |
5.0 |
pF |
||||
|
|
|
|||||
|
|
|
|
|
|
|
|
COUT |
Output Capacitance |
VOUT = 0 |
TSOP |
8.5 |
12 |
pF |
|
|
|
|
|
||||
BGA |
5.4 |
6.5 |
pF |
||||
|
|
|
|||||
|
|
|
|
|
|
|
|
CIN2 |
Control Pin Capacitance |
VIN = 0 |
TSOP |
7.5 |
9 |
pF |
|
|
|
|
|
||||
BGA |
3.9 |
4.7 |
pF |
||||
|
|
|
|||||
|
|
|
|
|
|
|
Notes
1.Sampled, not 100% tested.
2.Test conditions TA = 25°C, f = 1.0 MHz.
60 |
S29AL032D |
S29AL032D_00_A9 January 19, 2007 |