S29AL032D
16. Test Conditions
Figure 16.1 |
Test Setup |
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3.3 V |
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Device |
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2.7 k |
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Under |
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Test |
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CL |
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6.2 k |
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Note |
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New |
Design |
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Diodes are IN3064 or equivalent. |
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Table 17. |
Test Specifications |
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Speed Option |
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70 |
90 |
Unit |
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Output Load |
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1 TTL gate |
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Output Load Capacitance, CL |
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30 |
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100 |
pF |
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(including jig capacitance) |
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Input Rise and Fall Times |
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5 |
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ns |
Input Pulse Levels |
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0.0 or VCC |
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V |
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Input timing measurement reference levels |
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0.5 VCC |
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V |
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Output timing measurement reference levels |
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0.5 VCC |
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V |
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16.1 Key to Switching Waveforms |
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Not |
Recommended |
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Waveform |
Inputs |
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Outputs |
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Steady |
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Changing from H to L
Changing from L to H
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Don’t Care, Any Change Permitted |
Changing, State Unknown |
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Does Not Apply |
Center Line is High Impedance State (High Z) |
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Document Number: 002-02003 Rev. *B |
Page 46 of 64 |