
- •Preface
- •Contents
- •1.1 Fundamentals of the semiclassical laser theory
- •1.1.1 The laser oscillator
- •1.1.2.2 Homogeneous, isotropic, linear dielectrics
- •1.1.2.2.1 The plane wave
- •1.1.2.2.2 The spherical wave
- •1.1.2.2.3 The slowly varying envelope (SVE) approximation
- •1.1.2.3 Propagation in doped media
- •1.1.3 Interaction with two-level systems
- •1.1.3.1 The two-level system
- •1.1.3.2 The dipole approximation
- •1.1.3.2.1 Inversion density and polarization
- •1.1.3.3.1 Decay time T1 of the upper level (energy relaxation)
- •1.1.3.3.1.1 Spontaneous emission
- •1.1.3.3.1.2 Interaction with the host material
- •1.1.3.3.1.3 Pumping process
- •1.1.3.3.2 Decay time T2 of the polarization (entropy relaxation)
- •1.1.4 Steady-state solutions
- •1.1.4.1 Inversion density and polarization
- •1.1.4.2 Small-signal solutions
- •1.1.4.3 Strong-signal solutions
- •1.1.5 Adiabatic equations
- •1.1.5.1 Rate equations
- •1.1.5.2 Thermodynamic considerations
- •1.1.5.3 Pumping schemes and complete rate equations
- •1.1.5.3.1 The three-level system
- •1.1.5.3.2 The four-level system
- •1.1.5.5 Rate equations for steady-state laser oscillators
- •1.1.6 Line shape and line broadening
- •1.1.6.1 Normalized shape functions
- •1.1.6.1.1 Lorentzian line shape
- •1.1.6.1.2 Gaussian line shape
- •1.1.6.1.3 Normalization of line shapes
- •1.1.6.2 Mechanisms of line broadening
- •1.1.6.2.1 Spontaneous emission
- •1.1.6.2.2 Doppler broadening
- •1.1.6.2.3 Collision or pressure broadening
- •1.1.6.2.4 Saturation broadening
- •1.1.6.3 Types of broadening
- •1.1.6.3.1 Homogeneous broadening
- •1.1.6.3.2 Inhomogeneous broadening
- •1.1.6.4 Time constants
- •1.1.7 Coherent interaction
- •1.1.7.1 The Feynman representation of interaction
- •1.1.7.3 Propagation of resonant coherent pulses
- •1.1.7.3.2 Superradiance
- •1.1.8 Notations
- •References for 1.1
- •2.1.1 Introduction
- •2.1.3 Radiometric standards
- •2.1.3.1 Primary standards
- •2.1.3.2 Secondary standards
- •References for 2.1
- •2.2 Beam characterization
- •2.2.1 Introduction
- •2.2.2 The Wigner distribution
- •2.2.3 The second-order moments of the Wigner distribution
- •2.2.4 The second-order moments and related physical properties
- •2.2.4.3 Phase paraboloid and twist
- •2.2.4.4 Invariants
- •2.2.4.5 Propagation of beam widths and beam propagation ratios
- •2.2.5.1 Stigmatic beams
- •2.2.5.2 Simple astigmatic beams
- •2.2.5.3 General astigmatic beams
- •2.2.5.4 Pseudo-symmetric beams
- •2.2.5.5 Intrinsic astigmatism and beam conversion
- •2.2.6 Measurement procedures
- •2.2.7 Beam positional stability
- •References for 2.2
- •3 Linear optics
- •3.1 Linear optics
- •3.1.1 Wave equations
- •3.1.2 Polarization
- •3.1.3 Solutions of the wave equation in free space
- •3.1.3.1 Wave equation
- •3.1.3.1.1 Monochromatic plane wave
- •3.1.3.1.2 Cylindrical vector wave
- •3.1.3.1.3 Spherical vector wave
- •3.1.3.2 Helmholtz equation
- •3.1.3.2.1 Plane wave
- •3.1.3.2.2 Cylindrical wave
- •3.1.3.2.3 Spherical wave
- •3.1.3.2.4.2 Real Bessel beams
- •3.1.3.2.4.3 Vectorial Bessel beams
- •3.1.3.3 Solutions of the slowly varying envelope equation
- •3.1.3.3.1 Gauss-Hermite beams (rectangular symmetry)
- •3.1.3.3.2 Gauss-Laguerre beams (circular symmetry)
- •3.1.3.3.3 Cross-sectional shapes of the Gaussian modes
- •3.1.4.4.2 Circular aperture with radius a
- •3.1.4.4.2.1 Applications
- •3.1.4.4.3 Gratings
- •3.1.5 Optical materials
- •3.1.5.1 Dielectric media
- •3.1.5.2 Optical glasses
- •3.1.5.3 Dispersion characteristics for short-pulse propagation
- •3.1.5.4 Optics of metals and semiconductors
- •3.1.5.6 Special cases of refraction
- •3.1.5.6.2 Variation of the angle of incidence
- •3.1.5.7 Crystal optics
- •3.1.5.7.2 Birefringence (example: uniaxial crystals)
- •3.1.5.8 Photonic crystals
- •3.1.5.9 Negative-refractive-index materials
- •3.1.5.10 References to data of linear optics
- •3.1.6 Geometrical optics
- •3.1.6.1 Gaussian imaging (paraxial range)
- •3.1.6.1.1 Single spherical interface
- •3.1.6.1.2 Imaging with a thick lens
- •3.1.6.2.1 Simple interfaces and optical elements with rotational symmetry
- •3.1.6.2.2 Non-symmetrical optical systems
- •3.1.6.2.3 Properties of a system
- •3.1.6.2.4 General parabolic systems without rotational symmetry
- •3.1.6.2.5 General astigmatic system
- •3.1.6.2.6 Symplectic optical system
- •3.1.6.2.7 Misalignments
- •3.1.6.3 Lens aberrations
- •3.1.7 Beam propagation in optical systems
- •3.1.7.2.1 Stigmatic and simple astigmatic beams
- •3.1.7.2.1.1 Fundamental Mode
- •3.1.7.2.1.2 Higher-order Hermite-Gaussian beams in simple astigmatic beams
- •3.1.7.2.2 General astigmatic beam
- •3.1.7.3 Waist transformation
- •3.1.7.3.1 General system (fundamental mode)
- •3.1.7.3.2 Thin lens (fundamental mode)
- •3.1.7.4 Collins integral
- •3.1.7.4.1 Two-dimensional propagation
- •3.1.7.4.2 Three-dimensional propagation
- •3.1.7.5 Gaussian beams in optical systems with stops, aberrations, and waveguide coupling
- •3.1.7.5.1 Field distributions in the waist region of Gaussian beams including stops and wave aberrations by optical system
- •3.1.7.5.2 Mode matching for beam coupling into waveguides
- •3.1.7.5.3 Free-space coupling of Gaussian modes
- •References for 3.1
- •4.1 Frequency conversion in crystals
- •4.1.1 Introduction
- •4.1.1.1 Symbols and abbreviations
- •4.1.1.1.1 Symbols
- •4.1.1.1.2 Abbreviations
- •4.1.1.1.3 Crystals
- •4.1.1.2 Historical layout
- •4.1.2 Fundamentals
- •4.1.2.1 Three-wave interactions
- •4.1.2.2 Uniaxial crystals
- •4.1.2.3 Biaxial crystals
- •4.1.2.5.1 General approach
- •4.1.3 Selection of data
- •4.1.5 Sum frequency generation
- •4.1.7 Optical parametric oscillation
- •4.1.8 Picosecond continuum generation
- •References for 4.1
- •4.2 Frequency conversion in gases and liquids
- •4.2.1 Fundamentals of nonlinear optics in gases and liquids
- •4.2.1.1 Linear and nonlinear susceptibilities
- •4.2.1.2 Third-order nonlinear susceptibilities
- •4.2.1.3 Fundamental equations of nonlinear optics
- •4.2.1.4 Small-signal limit
- •4.2.1.5 Phase-matching condition
- •4.2.2 Frequency conversion in gases
- •4.2.2.1 Metal-vapor inert gas mixtures
- •4.2.2.3 Mixtures of gaseous media
- •References for 4.2
- •4.3 Stimulated scattering
- •4.3.1 Introduction
- •4.3.1.1 Spontaneous scattering processes
- •4.3.1.2 Relationship between stimulated Stokes scattering and spontaneous scattering
- •4.3.2 General properties of stimulated scattering
- •4.3.2.1 Exponential gain by stimulated Stokes scattering
- •4.3.2.2 Experimental observation
- •4.3.2.2.1 Generator setup
- •4.3.2.2.2 Oscillator setup
- •4.3.2.3 Four-wave interactions
- •4.3.2.3.1 Third-order nonlinear susceptibility
- •4.3.2.3.3 Higher-order Stokes and anti-Stokes emission
- •4.3.2.4 Transient stimulated scattering
- •4.3.3 Individual scattering processes
- •4.3.3.1 Stimulated Raman scattering (SRS)
- •4.3.3.2 Stimulated Brillouin scattering (SBS) and stimulated thermal Brillouin scattering (STBS)
- •4.3.3.3 Stimulated Rayleigh scattering processes, SRLS, STRS, and SRWS
- •References for 4.3
- •4.4 Phase conjugation
- •4.4.1 Introduction
- •4.4.2 Basic mathematical description
- •4.4.3 Phase conjugation by degenerate four-wave mixing
- •4.4.4 Self-pumped phase conjugation
- •4.4.5 Applications of SBS phase conjugation
- •4.4.6 Photorefraction
- •References for 4.4
56 |
2.2.4 The second-order moments and related physical properties |
[Ref. p. 70 |
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There are ten centered second-order moments, specified by k + + m + n = 2. Three pure spatial moments, x2 c , y2 c , xy c , three pure angular moments, u2 c , v2 c , uv c , and four mixed moments, x u c , y v c , x v c , and y u c . The centered second-order moments are associated to the beam extents in the near and far field and to the propagation of beam widths as will be discussed in the next section.
Only the three pure spatial moments can directly be measured since they can be obtained from the power density distribution in the observation plane by
xk y c = P I (x, y) (x − x )k |
(y − y ) dx dy |
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P = |
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As the beam propagates through optical systems the Wigner distribution changes and consequently the moments change, too. A simple propagation law for the centered second-order moments through aberration-free optical systems can be derived from the propagation law of the Wigner distribution (2.2.9). Combining the ten moments in a symmetric 4 × 4-matrix, the variance matrix
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delivers the propagation law |
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Pout = S · Pin · ST , |
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(2.2.18) |
where Pin and Pout are the variance matrices in the input and output planes of the optical system, respectively, and S is the system matrix.
2.2.4The second-order moments and related physical properties
In this section the relations between the centered second-order moments and some more physical properties are discussed.
2.2.4.1 Near field
The three spatial-centered second-order moments are related to the spatial extent of the power density in the reference plane as can be derived from (2.2.13). For example, the centered secondorder moments x2 c , defined by
Landolt-B¨ornstein
New Series VIII/1A1

Ref. p. 70] |
2.2 Beam characterization |
57 |
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x2 c |
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can be considered as the intensity-weighted average of the squared distances in x-direction of all points in the plane from the beam-profile center. Obviously, this quantity increases with increasing beam extent in x-direction. A beam width in x-direction can be defined as
dx = 4 x2 c . (2.2.20)
The factor of 4 in this equation has been chosen by convention to adapt this beam-width definition to the former 1/e2-definition for the beam radius of Gaussian beams. For an aligned elliptical Gaussian beam profile,
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where wx and wy are the 1/e2-beam radii in x- and y-direction, respectively, the relation |
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holds. Similar, a beam width in y-direction can be defined as |
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The beam width along an arbitrary azimuthal direction enclosing an angle of α with the x-axis can be derived from a rotation of the coordinate system delivering
dα = 4 x2 c cos2 α + 2 xy c sin α cos α + y2 c sin2 α . (2.2.23)
In general, the beam width considered as a function of the azimuthal direction α has unique maximum and minimum. The related directions are orthogonal to each other and define the principal axes of the beam. The signed angle between the x-axis and that principal axis which is closer
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The beam width along that principal axis which is closer to the x-axis is determined by |
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Correspondingly, the beam width along the principal axis closer to the y-axis is given by |
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Hence, the three spatial-centered second-order moments define the size and orientation of the so-called variance ellipse as the representation of a beam profile’s extent (Fig. 2.2.3).
Beam profiles having approximately equal beam widths in both principal planes, dx ≈ dy , may be considered as circular and a beam diameter may be defined by
√
d = 2 2 x2 + y2 . (2.2.28)
Sometimes this is an useful definition even for non-circular beam profiles, denoted then as “generalized beam diameter”.
Landolt-B¨ornstein
New Series VIII/1A1

58 |
2.2.4 The second-order moments and related physical properties |
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[Ref. p. 70 |
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Fig. 2.2.3. Widths and variance ellipse of a power density profile. Left: widths dx and dy along the coordinate axes, middle: width dα along an arbitrary direction, right: widths dx and dy along the principal axes.
2.2.4.2 Far field
The three angular-centered second-order moments are related to the beam-profile extent in the far field, far away from the reference plane, or in the focal plane of a focusing lens. From the propagation law of the second-order moments, (2.2.18), the dependency of the spatial moments on the propagation distance z from the reference plane can be derived:
x2 c (z) = x2 c,0 + 2 z xu c,0 + z2 u2 c,0 ,2 |
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For large distances z the spatial moments depend only on the angular moments in the reference |
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F of that principal axis in the far field, which is closer to the x-axis is then |
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withy = z→∞ |
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η = sgn |
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(2.2.34) |
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The |
generalized beam divergence angle might be defined as |
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θ = 2 |
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u2 c + v2 c |
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The azimuthal orientation of the far field may di er from the orientation of the near field.
Landolt-B¨ornstein
New Series VIII/1A1

Ref. p. 70] |
2.2 Beam characterization |
59 |
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2.2.4.3 Phase paraboloid and twist
The four mixed moments xu c , xv c , yu c , and yv c are closely related to the phase properties of the beam in the reference plane. Together with the three spatial moments they determine the radii of curvature and azimuthal orientation of the best-fitting phase paraboloid. Although the phase properties of partially coherent beams might be quite complicated, it is always possible to find a best-fitting phase function being quadratic (bilinear) in x and y:
Φ (x, y) = k a x2 + 2 b x y + c y2 . |
(2.2.36) |
The best-fitting parameters a, b, c are defined by minimizing the generalized divergence angle, (2.2.35), if a phase function according to (2.2.36) would be subtracted from the actual phase distribution in the reference plane (e.g. by introducing a cylindrical lens) resulting in
a = |
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b = |
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c = |
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A phase distribution as given in (2.2.36) can be considered as a rotated phase paraboloid, with
ϕP = |
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as the signed angle between the x-axis and that principal axis of the phase paraboloid, which is closer to the x-axis, and with
R |
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µ = sgn (a − c) |
(2.2.43) |
as the radii of curvature along that principal axis of the phase paraboloid, which is closer to the x- and y-axis, respectively. The radii of curvature Rx and Rx independently may be positive or negative or infinite, the later indicating a plane phase front along that azimuthal direction. The azimuthal orientation of the phase paraboloid’s principal axes may di er from the orientation of the near field and/or far field.
If the radii of phase curvature along both principal axes are approximately equal, Rx ≈ Ry , a generalized phase curvature of the best-fitting rotational symmetric phase paraboloid is defined by
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yv c |
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Landolt-B¨ornstein
New Series VIII/1A1