

306 Carbon, Graphite, Diamond, and Fullerenes
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C |
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C |
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H. + C-H |
* |
H, |
+ ‘C. |
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I |
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I |
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In the second step, the activated |
surface-carbon |
radical |
reacts with the |
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carbon-hydrogen |
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species |
(acetylene as a monomer |
unit) |
in the |
gas |
phase |
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to become |
the |
site for carbon |
addition: |
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C |
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C |
H |
H |
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-\ |
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-\ |
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C.+C,H, |
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+,C- |
L |
=C. |
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C’ |
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C |
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The |
model |
is consistent |
with |
experimental |
observations |
and |
should |
||||||
provide a useful |
guideline |
for future experiments. |
A similar |
model has been |
|||||||||
proposed |
that |
is |
based on the addition |
of |
a methyl |
group to |
one |
of the |
|||||
carbonsfollowed |
|
by atomic |
hydrogen |
abstractionfromthe |
methyl group.t121t13] |
2.3Role of Atomic Hydrogen
Hydrogen, |
in |
normal |
conditions, |
is a |
diatomic |
molecule |
(H2) which |
|||||||||||||||||
dissociates |
at high |
temperature |
(i.e., |
>2000°C) |
or in a high current-density |
|||||||||||||||||||
arc to form atomic |
hydrogen. |
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The dissociation |
reaction |
is highly |
endothermic |
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(AH = 434.1 kJmol-l). |
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The |
rate of dissociation |
|
is a function of temperature, |
increasing |
rapidly |
|||||||||||||||||||
above |
2000°C. |
It also |
increases |
with |
decreasing |
pressure.tlO) |
The |
rate of |
||||||||||||||||
recombination |
(i.e., the formation |
|
of the |
molecule) |
is rapid |
since |
the |
mean- |
||||||||||||||||
free-path |
dependent |
half-life |
|
of atomic |
hydrogen |
is only |
0.3 |
s. |
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As |
shown |
in the models |
reviewed |
above, |
atomic |
hydrogen |
plays |
an |
||||||||||||||||
essential |
role in the |
surface |
|
and |
plasma |
chemistry |
of diamond |
deposition |
||||||||||||||||
as it contributes |
to the |
stabilization |
of the sp3 dangling |
|
bonds |
found |
on the |
|||||||||||||||||
diamond |
surface |
plane |
(Fig. |
|
13.1).t4] |
Without |
this |
stabilizing |
effect, |
these |
||||||||||||||
bonds |
would |
not be maintained |
and the diamond |
(111) |
plane would collapse |
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(flatten |
out) |
to the |
graphite |
structure. |
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The |
other |
function |
of atomic |
hydrogen |
is to |
remove |
graphite |
selec- |
||||||||||||||||
tively. |
In contrast |
with |
molecular |
|
hydrogen, |
atomic hydrogen |
is extremely |
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reactive. |
It etches |
graphite |
|
twenty |
times as fast as it etches diamond |
and |

CVD Diamond 307
even |
faster |
in |
the presence of |
oxygen. |
This etching ability |
is |
important |
||||
since, |
when |
graphite and |
diamond |
are deposited |
simultaneously, |
graphite |
|||||
is preferentially |
removed |
while |
most of the diamond |
remains.n51 |
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|
Thesetwo |
effects of atomic |
hydrogen, |
graphite |
removal |
and sp3 bond |
|||||
stabilization, |
are believed |
essential |
to the |
growth |
of CVD diamond. |
Figure 13.1. Schematic of CVD diamond structure showing hydrogen atoms bonded to growth surface.
2.4Effect of Oxygen and Oxygen Compounds
|
Beside |
the need for |
atomic |
hydrogen, |
the |
presence |
of oxygen or an |
|||||||||||||
oxygen |
compound |
such |
as H,O, |
CO, methanol, |
ethanol, |
or acetone, |
can be |
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an |
important |
|
contributor |
|
to diamond |
film |
formation. |
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A |
small |
amount |
of |
||||||||
oxygen |
added |
to methane |
and |
hydrogen tends |
to suppress |
the |
deposition |
|||||||||||||
of graphite |
by |
reducing |
the acetylene |
concentration |
as well |
as |
increasing |
|||||||||||||
the |
diamond |
growth rate.t61t16] The addition |
of water |
to hydrogen |
appears |
|||||||||||||||
to |
increase |
the formation |
of |
atomic |
hydrogen |
which |
would |
explain |
the |
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observed |
increased |
deposition |
|
rate. |
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Carbon, |
Graphite, Diamond, |
and Fullerenes |
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2.5 |
Halogen-Based |
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Deposition |
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It was recently found that diamond growth also occurs in several |
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halogen-based reactions. These reactions |
proceed at lower temperature |
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(250 - 750°C) than those based on the methyl-radical |
mechanism |
reviewed |
||||||||||
above. |
The |
halogen |
reaction mechanism |
is still |
controversial |
and the |
||||||
optimum |
precursor species are yet to be determined.t’q |
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To proceed, the reactions must be highly favored thermodynamically. |
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This |
is achieved |
when |
the reaction |
products are solid carbon and stable |
||||||||
gaseous |
fluorides |
or chlorides (HF, |
HCI, SFA. |
Typical |
reactions |
and their |
||||||
free energy at 1000 |
K are shown in Table 13.3. |
These |
free-energy values |
|||||||||
are for the formation |
of graphite and not diamond. |
However the diamond |
free-energy of formation is not much higher than that of graphite (AG = 2.87
kJ/mol) . |
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The deposition |
reaction |
is carried out in a simple |
flow tube. |
The |
||
amount of carbon-containing |
gas is maintained |
at ~5% of the overall |
gas |
|||
composition to retard formation of non-diamond |
carbon. |
The addition of |
||||
oxygen or oxygen compounds |
(air, H,O, CO,) enhandes |
growth. |
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Diamond growth with the halogen |
reactions |
has also been observed |
||||
with the hot-filament, |
RF-discharge, |
and microwave |
processes.t18]-t20) |
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These processes are described in the following section. |
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Table 13.3. Diamond-Forming Halogen Reactions and Their
Free-Energy[‘fl
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AG” at 1000 K |
Reaction |
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(kJ/mol) |
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CH,+C+2H2 |
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-4.5 |
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(for comparison) |
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CH,,t2F2+Ct4HF |
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-1126.5 |
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CCI,F, |
t 2H, |
+ |
C t |
2HCI |
t 2HF |
-407.6 |
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CH,OH |
t |
F2 + |
C t |
H,O |
t |
2HF |
-725.9 |
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CH,CH,OH |
t |
2F2 --+ 2C |
t |
H,O t 4HF |
-1358.7 |
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CH$H |
t 5l=, -+ C t 4HF |
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t SF, |
-2614.4 |
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CS2 t |
6F2 * |
C t 2SFe |
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-3407.2 |

CVD Diamond 309
3.0CVD DIAMOND PROCESSES
3.1General Characteristics
|
As mentioned above, the carbon species |
must be |
activated |
since |
at |
|||||||||||||
low |
pressure, |
graphite |
is thermodynamically |
stable, |
and without |
activation, |
||||||||||||
only |
graphite |
|
would be formed (see Ch. 11, Sec. 3.2). |
Activation |
is obtained |
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bytwo |
basic |
methods: |
high temperature |
and plasma, |
both of which |
requiring |
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a great |
deal |
|
of energy. |
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Several |
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CVD processes |
based on these |
two methods |
are presently |
in |
|||||||||||
use. These |
processes |
are continuously |
being |
|
expanded |
and improved |
and |
|||||||||||
new |
ones |
are regularly |
proposed. |
The |
four most important |
at this |
time |
are: |
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high-frequency |
(glow) |
plasma, |
plasma |
arc, thermal |
CVD, and |
combustion |
||||||||||||
synthesis |
(oxy-acetylene torch). |
Their |
major |
characteristics |
are |
summa- |
||||||||||||
rized in Table |
13.4.L6] |
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Table 13.4. Characteristics of Diamond Deposition Processes
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Substrate |
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Activation |
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Deposition |
Temperature |
Main |
|
Method |
Process |
|
Rate |
Control |
Product |
Glow-discharge |
Microwave |
|
Low |
Good |
Coating |
plasma |
RF |
(0.1 |
- lOpm/h) |
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Arc plasma |
DC Arc |
|
High |
Poor |
Coating |
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RF Arc |
(50 - 1000 pm/h) |
Plates |
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Thermal |
Hot-filament |
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Low |
Good |
Coating |
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(0.1 |
- 10 pm/h) |
Plates |
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Combustion |
Torch |
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High |
Poor |
Coating |
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Powder |

310 Carbon, Graphite, Diamond, and Fullerenes |
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3.2 |
Types of Plasma |
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Most |
diamond-deposition |
processes |
require |
a plasma. |
As |
the |
tem- |
|||||||||
perature of a gas |
is increased, |
its atoms |
are gradually |
ionized, |
that |
is, they |
|||||||||||
are stripped |
of their |
electrons |
and a plasma |
is formed which |
consists |
of ions |
|||||||||||
(positive |
charge), |
|
electrons |
(negative |
charge), |
and |
atoms |
that |
have |
not |
|||||||
been |
ionized |
(neutral).t21) |
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Two |
types of plasma |
are currently |
used for the deposition |
of diamond: |
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glow-discharge |
plasma |
(non-isothermal) |
and |
arc |
plasma |
(isothermal). |
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Their |
characteristics |
are |
shown in Table |
13.5 |
and |
are described |
|
in more |
|||||||||
detail |
in the |
following sections. |
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Table 13.5. Characteristics |
of Plasmas for Diamond |
Depositiont2’t |
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Glow-Discharge |
Arc |
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Plasma |
Type |
Non-Isothermal |
Isothermal |
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(non-equilibrium) |
(equilibrium) |
|
Frequency |
50 kHz - 3.45 MHz |
-1 |
MHz |
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and 2.45 GHz |
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(microwave) |
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Power |
|
1 -1OOkW |
1 -2OMW |
|
Flow rate |
mg/s |
none |
||
Electron |
concentration |
109 - 1012/cm3 |
10’ 4/cm3 |
|
Pressure |
|
200 Pa - 0.15 atm |
0.15- |
1 atm |
Electron |
temperature |
104K |
104K |
Atom temperature |
500 K |
104K |

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CVD Diamond |
311 |
|||||
3.3 Glow-Discharge |
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(Microwave) |
Plasma |
Deposition |
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A glow-discharge |
(non-isothermal) |
plasma |
is generated |
in a gas |
by a |
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high-frequency |
|
|
electric |
field |
such |
as microwave |
at relatively |
low |
pressure. |
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In such |
a plasma, |
the |
following |
events |
occur: |
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|
. |
In the |
high-frequency |
electric field, the gases are ionized |
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into |
electrons |
and |
ions. |
The |
electrons, |
with |
their |
very |
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||||||||||||
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|
small |
mass, |
are quickly accelerated |
to high energy |
levels |
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corresponding |
to 5000 |
K or higher. |
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n |
The |
heavier |
ions with their greater |
inertia |
cannot respond |
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to the |
rapid |
changes |
in field direction, |
As |
a result, |
their |
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temperature |
and |
that |
of |
the |
plasma |
|
remain |
low, |
as |
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opposed |
|
to the electron |
temperature |
(hence |
the |
name |
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non-isothermal |
plasma). |
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. The |
high-energy |
electrons |
collide |
with the gas molecules |
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with |
resulting |
dissociation |
and |
generation |
of reactive |
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chemical species and the initiation |
of the chemical |
reaction. |
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||||||||||||||||||
The most common frequencies |
in diamond |
deposition |
arethe |
microwave |
|||||||||||||||||||||
(MW) frequency |
|
at 2.45 GHz and, to a lesser |
degree, radio frequency |
(RF) at |
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13.45MHz(theuseofthesefrequenciesmustcomplywithfederalregulations). |
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|||||||||||||||||||||
Deposition |
|
|
Process. |
A typical |
microwave |
|
plasma |
for |
diamond |
||||||||||||||||
deposition |
has an electron |
density |
of approximately |
1Go electrons/m3, |
and |
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sufficient |
|
energy |
to dissociate |
|
hydrogen. |
A microwave-deposition |
|
reactor |
|||||||||||||||||
is shown |
schematically |
in Fig. 13.2.t1slt22] The |
substrate |
(typically |
a silicon |
||||||||||||||||||||
wafer) is positioned |
|
at the lower end |
of the |
plasma. |
Gases are introduced |
||||||||||||||||||||
at the top of the |
reactor, |
flow |
around |
and |
react |
at the substrate, |
and |
|
the |
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gaseous |
by-products |
are removed |
into the exhaust. |
The substrate |
must |
be |
|||||||||||||||||||
heated |
to |
800 |
- 1000°C |
for |
diamond |
to form. |
This |
can be done |
by |
|
the |
||||||||||||||
interaction |
with |
the |
plasma |
and |
microwave |
power |
but |
this |
is |
difficult |
|
to |
|||||||||||||
regulate |
and, |
more |
commonly, |
the substrate |
is heated |
directly |
by radiant |
or |
|||||||||||||||||
resistance |
heaters |
which |
provide |
more |
accurate |
temperature |
control. |
|
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||||||||||||||||
Typical |
microwave |
deposition |
conditions |
are |
the following: |
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Incident |
Power: |
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600 |
W |
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Substrate |
Temp.: |
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800 - 1000°C |
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|
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Gas |
mixture |
HdCH,: |
|
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50/l |
to 200/l |
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Pressure: |
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|
10 to 5000 |
Pa |
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|||||||||
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Total |
gas flow: |
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|
20 - 200 |
scm3/min |
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|
|
312 Carbon, Graphite, Diamond, and Fullerenes
Optic?1 Window
Ew
Flow Control
System
Wavenuide
,
Tuner
Microwave
Generator
1 2.45 GHt 1
Figure 13.2. Schematic of microwave-plasmadeposition apparatus.
The morphology and properties of the deposited coating vary as a
function of substrate temperature, gas ratio, and the intensity of the plasma
at the deposition surface. Deposition |
rate is low, averaging |
1 - 3pmlh. This |
|||
may be due to the limited amount |
of atomic |
hydrogen |
available |
in the |
|
deposition zone (estimated at 5%). |
|
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|
|
An advantage of microwave |
plasma is |
its stability which |
allows |
||
uninterrupted deposition lasting for days if necessary. |
Howeverthe |
plasma |
|||
can be easily disturbed by the addition of oxygenated |
compounds. |
|
CVD Diamond 313
Electron Cyclotron Resonance (ECR). A microwave plasma can also be produced by electron cyclotron resonance (ECR), through the propercombinationof electricand magneticfields. Cyclotron resonance is achieved when the frequency of the alternating electric field is made to match the natural frequency of the electrons orbiting the lines of force of the magnetic field. This occurs at the standard microwave frequency of 2.45 GHz with a magnetic field of 875 Gauss. An ECR plasma reactor suitable for the deposition of diamond is shown schematically in Fig. 13.3.[231
Microwave |
Magnetron |
Microwave |
|
|
Short |
||
Network |
|
Feed |
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Circuiting |
||
SUPPlY + |
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/ |
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/Slide |
||
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I |
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Carrier |
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|
WaveGuide-
Vacuum Pumps
Figure 13.3. |
Schematic of electron-cyclotron-resonance |
(ECR) apparatus for the |
deposition of |
diamond.[23] |
|
314 |
Carbon, |
Graphite, |
|
Diamond, |
and |
Fullerenes |
|
|
|
|
|
|
|||||||||
|
An |
ECR |
plasma |
has |
two |
basic |
advantages |
for |
the |
deposition |
of |
||||||||||
diamond: |
(a) itminimizes |
|
the potential |
substrate |
damage |
caused |
by high- |
||||||||||||||
intensity |
ion |
bombardment, |
usually found |
in an |
standard |
high-frequency |
|||||||||||||||
plasma where the ion energy |
may |
reach |
100 eV, |
(b) |
it minimizes |
the risk of |
|||||||||||||||
damaging |
heat-sensitive |
|
substrates |
since |
it operates |
at |
a |
relatively |
low |
||||||||||||
temperature. |
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||
|
Disadvantages |
are |
a more |
difficult |
process |
control |
and more costly |
||||||||||||||
equipment |
due |
to the |
added |
complication |
of the |
magnetic |
field. |
|
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|
|||||||||||
|
RF |
Plasma. |
The |
activation |
of |
the |
reaction |
and |
the |
generation |
of |
||||||||||
atomic hydrogen can also |
be obtained |
with |
an RF plasma |
(13.56 |
MHz) |
but |
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this |
process |
is more likely |
to produce |
diamond-like |
carbon |
(DLC) |
and |
not |
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pure |
diamond |
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(see |
Ch. |
14). |
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3.4Plasma-Arc Deposition
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In addition |
to microwave |
deposition, |
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another common |
plasma |
deposi- |
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tion |
system |
for |
diamond |
coatings |
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is based |
on |
plasma-arc. |
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Plasma-arc |
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deposition |
is |
usually |
obtained |
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in a high-intensity, |
low-frequency |
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arc, |
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generated |
between |
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two |
electrodes |
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by either |
direct |
or |
alternating |
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current. |
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The |
process |
requires |
a |
large |
amount |
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of |
power |
and |
the |
equipment |
is |
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Costly.t*41 |
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In a low-frequency |
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plasma, |
both |
electrons |
and |
ions respond |
to |
the |
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constantly, |
but |
relatively |
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slowly, |
changing |
field direction, |
as |
opposed |
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to a |
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high-frequency |
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plasma |
where only |
the |
electrons |
respond. |
Both |
electrons |
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and |
ions |
acquire |
energy |
and |
their |
temperature |
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is |
raised |
more |
or |
less |
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equally. |
The |
plasma |
is in equilibrium |
(isothermal) |
as opposed |
to the |
non- |
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isothermal |
condition |
found |
in a high-frequency |
plasma. |
Isothermal |
plas- |
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mas for diamond |
deposition |
are generated |
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at a higher |
pressure |
than |
glow- |
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discharge |
plasmas |
(0.15 to 1 atm). |
At such |
pressure, |
the average |
distance |
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traveled |
by the species |
between |
collisions |
(mean |
free |
path) is reduced |
and, |
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as a |
result, |
molecules |
and |
ions |
collide |
more frequently |
and |
heat |
more |
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readily. |
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By |
increasing |
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the |
electrical |
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energy |
in |
a |
fixed |
amount |
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of |
gas, |
the |
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temperature |
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is |
raised |
and |
may |
reach |
5000°C |
or |
higher.t*‘] |
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Such |
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high |
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temperatures |
produce |
an almost |
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complete |
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dissociation |
of the |
hydrogen |
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molecules, |
the |
CH |
radicals, |
and |
other |
active |
carbon |
species. |
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From |
this |
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standpoint, |
arc-plasma |
systems |
have an advantage |
over glow-discharge |
or |
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thermal CVD |
since |
these |
produce |
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a far |
smaller |
ratio |
of atomic |
hydrogen. |
CVD Diamond 315
DC Plasma System. Typical direct-current |
(DC) |
plasma |
deposition |
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systems |
are |
shown |
schematically |
in Fig. 13.4.[25j[26j |
Electrodes |
usually |
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consist |
of a water-cooled |
copper |
anode and a tungsten |
cathode. |
Several |
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gas-jet |
nozzles can be operated simultaneously |
and many design |
variations |
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are possible, |
including |
separate |
input nozzles |
for |
hydrogen and |
methane |
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(the latter mixed with |
argon) and the feeding of these gases in a coaxial feed |
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electrode. |
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Tungsten Cathode
Water Cooled
Holder for
Cathode
Water Cooled
Water Cooled |
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4To Vacuum Pump |
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Figure |
13.4. |
Schematic o‘f arc-discharge |
apparatus |
for the deposition |
of dia- |
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mond .~1 |
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Another |
system incorporates |
the |
interaction |
of a solenoid |
magnetic |
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field to give the arc a helical shape. |
This |
stabilizes |
and increases |
the |
length |
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of the |
arc.t27) |
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