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JTAG and On-Chip Emulation (OnCE™ )

 

 

JTAG

OnCE

 

 

OnCE Command,

 

Test

Status & Control

 

 

External

Access

XAB1

Interface

Port

PAB

 

 

Controller

Breakpoint Logic

 

 

 

 

Trace Logic

 

 

Event Counter

 

 

PDB

 

 

PGDB

 

 

Pipeline

 

 

Registers

 

 

PAB

 

 

FIFO

 

 

History

 

 

Buffer

 

 

AA0093

Figure 9-1. JTAG/OnCE Interface Block Diagram

As already noted, the JTAG module is the master. It enables interaction with the debug services provided by the OnCE, and its external serial interface is used by the OnCE port for sending and receiving debugging commands and data.

9.2 JTAG Port

Problems associated with testing high-density circuit boards have led to the development of a proposed standard under the sponsorship of the Test Technology Committee of IEEE and the Joint Test Action Group (JTAG). The resulting standard, called the IEEE Standard Test Access Port and Boundary-Scan Architecture, specifies industry-standard, in-circuit device testing and diagnosis. The DSP56800 family provides a dedicated test access port (TAP) that is fully compatible with this standard, commonly referred to as the “JTAG port.”

This section provides an overview of the capabilities of the JTAG port as implemented on the DSP56800. Information provided here is intended to supplement the supporting IEEE 1149.1a-1993 document, which outlines the internal details, applications, and overall methodology of the standard. Specific details on the implementation of the JTAG port for a given DSP56800-based device are provided in that device’s user’s manual.

9-2

DSP56800 Family Manual

 

JTAG Port

9.2.1 JTAG Capabilities

The DSP56800 JTAG port has the following capabilities:

Performing boundary scan operations to test circuit-board electrical continuity

Sampling the DSP56800-based device system pins during operation and transparently shifting out the result in the boundary scan register; preloading values to output pins prior to performing a boundary scan operation

Querying identification information (manufacturer, part number, and version) from a DSP56800-based device

Adding a weak pull-up device on all input signals to cause all open inputs to report a logic 1 and to force a predictable internal state while performing external boundary scan operations

Disabling the output drive to pins during circuit-board testing

Forcing test data onto the outputs of a DSP56800-based device

Providing a means of accessing the OnCE controller and circuits to control a target system

Providing a means of entering the debug mode of operation

Bypassing the DSP56800 core for a given circuit-board test by effectively reducing the boundary scan register to a single cell

Section 9.2.2, “JTAG Port Architecture,” provides an overview of the port’s architecture and commands. For additional information on the JTAG port’s implementation and command set, see the appropriate DSP56800-based device’s user’s manual.

9.2.2 JTAG Port Architecture

The JTAG module consists of the logic necessary to support boundary scan testing as defined in the IEEE specification. Although tightly coupled to the DSP56800’s core logic, it is an independent module, and, when disabled, it is guaranteed to have no impact on the function of the core.

The JTAG port consists of the following components:

Serial communications interface

Command decoder and interpreter

Boundary scan register

ID register

These units, and the overall once port architecture, are shown in Figure 9-2 on page 9-4.

JTAG and On-Chip Emulation (OnCE™ )

9-3

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