- •Task №1
- •3. Evaluation of the tangential sensitivity of the detector diode
- •4. The main similarities and differences in the functional role, structure, and parameters of microwave devices numbered 1 (detector diode) and 2 (pin diode)
- •4.1 Detector diode
- •4.1.1 The functional role of the detector diode
- •4.1.2 Structure of the detector diode
- •4.1.3 Parameters of the detector diode
- •1. Volt-ampere characteristic:
- •2. Total resistance:
- •3. Cutoff frequency:
- •4. Current sensitivity:
- •5. Tangential sensitivity:
- •6. Noise ratio:
- •4.2 Pin diode
- •4.2.1 The functional role of the pin diode
- •4.2.2 Pin diode structure
- •4.2.3 Pin diode parameters
- •1. Volt-ampere characteristic:
- •2. Transmission and locking losses:
- •3. Quality coefficient:
- •4. Turn-on time of the pin diode:
- •5. Cutoff frequency:
- •4.3 Similarities and differences of the detector diode and pin diode
- •4.3.1 Differences between the detector diode and pin diode
- •4.3.2 Similarities of the detector diode and pin diode
- •5. Description of circuit models of microwave diodes with positive dynamic resistance
- •5.1 Description of the pin diode circuit model
- •5.2 Description of the mixer diode circuit model
- •Task №2 Diodes with negative dynamic resistance.
- •1.2 Gunn diode graphs (GaAs)
- •2. Representation of the device in the form of a layered structure with different differential mobility
- •2.1 Representation of the impatt diode in the form of a layered structure with different differential mobility
- •2.2 Representation of the Gunn diode in the form of a layered structure with different differential mobility
- •Task №3 Transistors.
- •1.2 Calculation of the gate length of a field-effect transistor
- •1.3 Analysis of the obtained results of calculating the thickness of the bipolar transistor base and the gate length of the field effect transistor
- •1.4 Calculation of the angle of flight of a bipolar transistor
- •1.5 Calculation of the angle of flight of a field-effect transistor
- •2.1 Advantages and disadvantages of hemt (High Electron Mobility Transistor)
- •2.2 Advantages and disadvantages of transistors with ballistic transport
- •2.3 Calculation of the thickness of the high-alloyed hemt region
- •3.1 GaN usage trend
- •3.2 InP usage trend
- •3.3 SiC usage trend
- •3.4 Diamond (c) usage trend
- •4.1 Input and output volt-ampere characteristics of three sbgfet with the same size, doping level, but made of Si, GaN, GaAs
- •4.2 How will the characteristics change if the gate width is increased
- •6. Connection of low-frequency noise with transistor manufacturing technology
- •7. Image of a low-signal equivalent Schottky-barrier transistor circuit. Explanation of how such a scheme is better or worse than s-parameters
2. Total resistance:
The total resistance of the detector diode can be expressed using the following relation [6]:
Zd = Rd + jXd (7)
At the same time, it is worth noting, based on the equivalent diode circuit (picture 4), that the impedance of the diode depends on both the junction resistance Rj and the capacitance of the junction Cj, varying with the variation of the bias voltage, and from the parasitic parameters of the diode: the resistance of the thickness of the semiconductor RS, the capacitance of the housing CКОРП and the inductance of the supply conductors LS. With a positive bias, for example, in a positive half-period of microwave oscillations, the dominant factor affecting the operation of the device is the presence of resistance Rs. With a negative displacement due to the expansion of the spatial charge region, the capacitance of the Cj junction increases and its influence begins to prevail over the influence of the resistance of the ohmic regions. In view of this, with a negative polarity of the voltage applied to the diode, it is customary to neglect the RS resistor, and with a positive one, the capacitance Cj [6].
3. Cutoff frequency:
The cutoff frequency is the limiting frequency at which the device can maintain different conductivity when the polarity of the applied voltage changes. The value of the boundary frequency of the detector diode is calculated by the following formula [5]:
=
=
=
=
(8)
Based on the expression for the cutoff frequency of the detector diode, we conclude that preference should be given to semiconductors with high carrier mobility when choosing materials for the detector diode in weak fields and with a high level of doping ND.
4. Current sensitivity:
The conversion efficiency when operating at direct current is evaluated by a parameter called current sensitivity. The value of the current sensitivity is equal to the ratio of the rectified current increment I to the value for a given microwave power Pmicro [7]:
=
=
(9)
where I0 – current at a constant bias applied to the diode.
5. Tangential sensitivity:
To describe the concept of tangential sensitivity, consider a generalized microwave circuit:
Picture 6 – Generalized microwave circuit
The power of the generator P is supplied to the microwave detector diode. Let the signal be a high-frequency modulated rectangular pulses (meander). The detected signal is amplified by a high-frequency amplifier and displayed on the oscilloscope screen. Depending on the power level installed on the generator, three characteristic cases are possible [8]:
Picture 7 – To the definition of tangential sensitivity
In the first case, the input power level is zero, and we can observe the noise present in the circuit. In the second case, the power level is large enough, so you can easily distinguish a useful signal against the background of noise. The third case is of particular interest: the upper bound of the noise strip in the absence of a signal coincides with the lower bound of the noise strip in the presence of a signal. With a further decrease in the power of the useful signal, noise will begin to drown out the useful signal. This minimum value of the power dissipated by the diode is the tangential sensitivity. However, for the convenience of work, when determining tangential sensitivity, it is customary to use an expression in which it is measured in decibels relative to 1 mW – in dBm [8].
Thus, the tangential sensitivity of the detector diode is determined by the following expression [9]:
= 10lg (10)
