- •Task №1
- •3. Evaluation of the tangential sensitivity of the detector diode
- •4. The main similarities and differences in the functional role, structure, and parameters of microwave devices numbered 1 (detector diode) and 2 (pin diode)
- •4.1 Detector diode
- •4.1.1 The functional role of the detector diode
- •4.1.2 Structure of the detector diode
- •4.1.3 Parameters of the detector diode
- •1. Volt-ampere characteristic:
- •2. Total resistance:
- •3. Cutoff frequency:
- •4. Current sensitivity:
- •5. Tangential sensitivity:
- •6. Noise ratio:
- •4.2 Pin diode
- •4.2.1 The functional role of the pin diode
- •4.2.2 Pin diode structure
- •4.2.3 Pin diode parameters
- •1. Volt-ampere characteristic:
- •2. Transmission and locking losses:
- •3. Quality coefficient:
- •4. Turn-on time of the pin diode:
- •5. Cutoff frequency:
- •4.3 Similarities and differences of the detector diode and pin diode
- •4.3.1 Differences between the detector diode and pin diode
- •4.3.2 Similarities of the detector diode and pin diode
- •5. Description of circuit models of microwave diodes with positive dynamic resistance
- •5.1 Description of the pin diode circuit model
- •5.2 Description of the mixer diode circuit model
- •Task №2 Diodes with negative dynamic resistance.
- •1.2 Gunn diode graphs (GaAs)
- •2. Representation of the device in the form of a layered structure with different differential mobility
- •2.1 Representation of the impatt diode in the form of a layered structure with different differential mobility
- •2.2 Representation of the Gunn diode in the form of a layered structure with different differential mobility
- •Task №3 Transistors.
- •1.2 Calculation of the gate length of a field-effect transistor
- •1.3 Analysis of the obtained results of calculating the thickness of the bipolar transistor base and the gate length of the field effect transistor
- •1.4 Calculation of the angle of flight of a bipolar transistor
- •1.5 Calculation of the angle of flight of a field-effect transistor
- •2.1 Advantages and disadvantages of hemt (High Electron Mobility Transistor)
- •2.2 Advantages and disadvantages of transistors with ballistic transport
- •2.3 Calculation of the thickness of the high-alloyed hemt region
- •3.1 GaN usage trend
- •3.2 InP usage trend
- •3.3 SiC usage trend
- •3.4 Diamond (c) usage trend
- •4.1 Input and output volt-ampere characteristics of three sbgfet with the same size, doping level, but made of Si, GaN, GaAs
- •4.2 How will the characteristics change if the gate width is increased
- •6. Connection of low-frequency noise with transistor manufacturing technology
- •7. Image of a low-signal equivalent Schottky-barrier transistor circuit. Explanation of how such a scheme is better or worse than s-parameters
3.1 GaN usage trend
There is a direct relationship between the band gap and the critical strength of the breakdown field of the (electrical) conductor. Gallium nitride boasts a breakdown field strength of 3000 kV/cm, while the breakdown field strength of silicon is 300 kV/cm, which demonstrates approximately ten times the ability of gallium nitride to maintain high voltages. Such breakdown field strengths make the connections significantly more adapted to work with higher voltages and generate lower leakage currents [30].
he high mobility of electrons and the rate of their saturation in WBG semiconductors make it possible to work at higher frequencies. Gallium nitride demonstrates electron mobility of the order of 1500 cm2/V s. That is, gallium nitride (GaN) is suitable for high-speed switching.
The wide band gap makes it possible for the GaN transistor to operate at high levels of temperature and radiation. Theoretically, GaN-based transistors with a band gap of 3,4 eV should remain operational at temperatures up to 400°С. In practice, at present, the maximum temperature of stable operation of transistors made on silicon carbide substrates is more than 200°С.
The record specific power density is one of the most outstanding achievements in the field of creating high-frequency GaN components of a new generation. The maximum critical electric field strength (10 times greater than that of silicon) makes it possible to realize breakdown voltages of 100 - 300 V and raise the operating drain voltage to 50 - 100 V, which, combined with a high current density, provides a specific output power of industrial GaN transistors of 3 - 10 W per 1 millimeter of gate width (up to 30 W/mm in laboratory samples), which is an order of magnitude higher than the specific output power of GaAs transistors. A high drain supply voltage leads to an order of magnitude increase in the impedance of the drain load and a significant facilitation of matching the transistor with the load [31].
Due to the significantly higher thermal conductivity of both epitaxial films and the carrier substrate, as well as due to the three times greater band gap in transistors based on gallium nitride (GaN), large power values from one component are achieved, while reducing the size of the final products and eliminating the need for cooling systems.
The use of GaN transistors will reduce energy consumption in electric motor start-up systems, protect power grids from overloads and unexpected outages. In addition, a very high concentration of electrons in the region of a two-dimensional electron gas, combined with acceptable electron mobility, makes it possible to realize a large transistor current density and a high gain.
Table 2. Microsemi GaN transistors [31]
Transistor |
Operating frequencies, GHz |
Power, W |
Gain, dB |
Drain-source breakdown voltage, V |
2729GN-150 |
2,7-2,9 |
160 |
14 |
250 |
2729GN-270 |
2,7-2,9 |
280 |
14 |
250 |
2731GN-110 |
2,7-3,1 |
120 |
12 |
250 |
2731GN-200 |
2,7-3,1 |
220 |
12 |
250 |
3135GN-100 |
3,1-3,5 |
115 |
12 |
250 |
3135GN-170 |
3,1-3,5 |
180 |
12 |
250 |
2735GN-35 |
2,7-3,5 |
30 |
11 |
250 |
2735GN-100 |
2,7-3,5 |
100 |
11 |
250 |
Thus, the advantages of GaN are:
1. A high value of the critical field strength and the associated high breakdown voltage;
2. High electron mobility;
3. Stability of operation at high temperatures;
4. Simplicity and cheapness of circuit implementation;
5. Ease of obtaining wide gain bands, overlapping of several frequency ranges with one powerful transistor.
