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ADS6125, ADS6124

ADS6123, ADS6122

www.ti.com

SLAS560A–OCTOBER 2007–REVISED MARCH 2008

TIMING CHARACTERISTICS – LVDS AND CMOS MODES(1)

Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = DRVDD = 3.3 V, maximum rated sampling frequency, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF(2), IO = 3.5

mA, RL = 100 Ω (3), no internal termination, unless otherwise noted.

For timings at lower sampling frequencies, see section Output Timings in the APPLICATION INFORMATION of this data sheet.

 

PARAMETER

TEST CONDITIONS

ta

Aperture

 

 

delay

 

 

 

 

 

tj

Aperture

 

 

jitter

 

 

 

 

 

 

 

From global power

 

Wake-up

down

 

 

 

 

 

time

From standby

 

 

(to valid

From output

CMOS

 

data)

 

buffer

 

 

 

LVDS

 

 

disable

Latency

DDR LVDS MODE(4), DRVDD = 3.3 V

tsu

Data setup

time(5)

th

Data hold

time(5)

 

Clock

tPDI

propagation

 

delay

 

LVDS bit

 

clock duty

 

cycle

Data valid (6) to zero-cross of CLKOUTP

Zero-cross of CLKOUTP to data becoming invalid(6)

Input clock rising edge zero-cross to output clock rising edge zero-cross

Duty cycle of differential clock, (CLKOUTPCLKOUTM)

10 ≤ Fs ≤ 125 MSPS

 

ADS6125

 

 

ADS6124

 

 

ADS6123

 

 

ADS6122

 

 

FS = 125 MSPS

FS = 105 MSPS

FS = 80 MSPS

FS = 65 MSPS

UNIT

MIN

TYP

MAX

MIN

TYP

MAX

MIN

TYP

MAX

MIN

TYP

MAX

 

0.7

1.5

2.5

0.7

1.5

2.5

0.7

1.5

2.5

0.7

1.5

2.5

ns

 

150

 

 

150

 

 

150

 

 

150

 

fs rms

 

15

50

 

15

50

 

15

50

 

15

50

μs

 

15

50

 

15

50

 

15

50

 

15

50

μs

 

100

200

 

100

200

 

100

200

 

100

200

ns

 

200

500

 

200

500

 

200

500

 

200

500

ns

 

9

 

 

9

 

 

9

 

 

9

 

clock

 

 

 

 

 

 

 

 

cycles

 

 

 

 

 

 

 

 

 

 

 

 

1.7

2.3

 

2.5

3.1

 

3.9

4.5

 

5.4

6.0

 

ns

0.7

1.7

 

0.7

1.7

 

0.7

1.7

 

0.7

1.7

 

ns

4.3

5.8

7.3

4.3

5.8

7.3

4.3

5.8

7.3

4.3

5.8

7.3

ns

40%

47%

55%

40%

47%

55%

40%

47%

55%

40%

47%

55%

 

 

Data rise

tr

time,

tf

Data fall

 

time

tCLKRI

Output clock

SE

rise time,

tCLKFA

Output clock

LL

fall time

Rise time measured

 

 

 

 

 

 

from –50 mV to 50 mV

 

 

 

 

 

 

Fall time measured

70

100

170

70

100

170

from 50 mV to –50 mV

 

 

 

 

 

 

1 ≤ Fs ≤ 125 MSPS

 

 

 

 

 

 

Rise time measured

 

 

 

 

 

 

from –50 mV to 50 mV

 

 

 

 

 

 

Fall time measured

70

100

170

70

100

170

from 50 mV to –50 mV

 

 

 

 

 

 

1 ≤ Fs ≤ 125 MSPS

 

 

 

 

 

 

PARALLEL CMOS MODE, DRVDD = 2.5 V to 3.3 V, default output buffer drive strength (7)

tsu

Data setup

Data valid(8) to 50% of

2.9

4.4

 

3.6

5.1

 

time(5)

CLKOUT rising edge

 

 

 

Data hold

50% of CLKOUT

 

 

 

 

 

 

th

Rising edge to data

1.3

2.7

 

2.1

3.5

 

time

(5)

 

 

 

 

becoming invalid(8)

 

 

 

 

 

 

 

Clock

Input clock rising edge

 

 

 

 

 

 

tPDI

propagation

zero-cross to 50% of

5

6.5

7.9

5

6.5

7.9

 

delay

CLKOUT rising edge

 

 

 

 

 

 

70

100

170

70

100

170

ps

70

100

170

70

100

170

ps

5.1

6.6

 

6.5

8.0

 

ns

3.6

5.0

 

5.1

6.5

 

ns

5

6.5

7.9

5

6.5

7.9

ns

(1)Timing parameters are specified by design and characterization and not tested in production.

(2)CL is the Effective external single-ended load capacitance between each output pin and ground.

(3)IO Refers to the LVDS buffer current setting; RL is the differential load resistance between the LVDS output pair.

(4)Measurements are done with a transmission line of 100 Ω characteristic impedance between the device and the load.

(5)Setup and hold time specifications take into account the effect of jitter on the output data and clock.

(6)Data valid refers to logic high of +100 mV and logic low of –100 mV.

(7)For DRVDD < 2.2V, it is recommended to use external clock for data capture and NOT the device output clock signal (CLKOUT). See

Parallel CMOS interface in application section.

(8)Data valid refers to logic high of 2V (1.7V) and logic low of 0.8 V (0.7V) for DRVDD = 3.3V (2.5V).

Copyright © 2007–2008, Texas Instruments Incorporated

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Product Folder Link(s): ADS6125, ADS6124 ADS6123, ADS6122

ADS6125, ADS6124

ADS6123, ADS6122

www.ti.com

SLAS560A–OCTOBER 2007–REVISED MARCH 2008

TIMING CHARACTERISTICS – LVDS AND CMOS MODES (continued)

For timings at lower sampling frequencies, see section Output Timings in the APPLICATION INFORMATION of this data sheet.

PARAMETER

 

Output clock

 

duty cycle

 

Data rise

tr

time,

tf

Data fall

 

time

tCLKRI

Output clock

SE

rise time,

tCLKFA

Output clock

LL

fall time

 

 

ADS6125

 

 

ADS6124

 

 

ADS6123

 

 

ADS6122

 

 

TEST CONDITIONS

FS = 125 MSPS

FS = 105 MSPS

FS = 80 MSPS

FS = 65 MSPS

UNIT

 

MIN

TYP

MAX

MIN

TYP

MAX

MIN

TYP

MAX

MIN

TYP

MAX

 

Duty cycle of output

 

 

 

 

 

 

 

 

 

 

 

 

 

clock (CLKOUT)

45%

50%

55%

45%

50%

55%

45%

50%

55%

45%

50%

55%

 

10 ≤ Fs ≤ 125 MSPS

 

 

 

 

 

 

 

 

 

 

 

 

 

Rise time measured

 

 

 

 

 

 

 

 

 

 

 

 

 

from 20% to 80% of

 

 

 

 

 

 

 

 

 

 

 

 

 

DRVDD

 

 

 

 

 

 

 

 

 

 

 

 

 

Fall time measured

0.8

1.5

2.4

0.8

1.5

2.4

0.8

1.5

2.4

0.8

1.5

2.4

ns

from 80% to 20% of

 

 

 

 

 

 

 

 

 

 

 

 

 

DRVDD

 

 

 

 

 

 

 

 

 

 

 

 

 

1 ≤ Fs ≤ 125 MSPS

 

 

 

 

 

 

 

 

 

 

 

 

 

Rise time measured

 

 

 

 

 

 

 

 

 

 

 

 

 

from 20% to 80% of

 

 

 

 

 

 

 

 

 

 

 

 

 

DRVDD

 

 

 

 

 

 

 

 

 

 

 

 

 

Fall time measured

0.8

1.5

2.4

0.8

1.5

2.4

0.8

1.5

2.4

0.8

1.5

2.4

ns

from 80% to 20% of

 

 

 

 

 

 

 

 

 

 

 

 

 

DRVDD

 

 

 

 

 

 

 

 

 

 

 

 

 

1 ≤ Fs ≤ 125 MSPS

 

 

 

 

 

 

 

 

 

 

 

 

 

10

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Copyright © 2007–2008, Texas Instruments Incorporated

Product Folder Link(s): ADS6125, ADS6124 ADS6123, ADS6122

 

 

ADS6125, ADS6124

www.ti.com

 

ADS6123, ADS6122

 

 

SLAS560A–OCTOBER 2007–REVISED MARCH 2008

N+3

N+4

N+11

N+12

N+2

 

N+10

 

 

 

 

Sample N+1

 

N+9

 

N

 

 

 

Input

Signal

 

 

 

ta

 

 

 

 

 

 

 

 

 

CLKP

 

 

 

 

 

 

 

 

 

 

 

 

Input

 

 

 

 

 

 

 

 

 

 

 

 

Clock

 

 

 

 

 

 

 

 

 

 

 

 

CLKM

 

 

 

 

 

 

 

 

 

 

 

 

CLKOUTM

 

 

 

 

 

 

 

 

 

 

 

 

CLKOUTP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tsu

tPDI

 

 

 

 

 

 

 

 

 

 

 

th

DDR

 

 

 

 

9 Clock Cycles

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

LVDS

 

 

 

 

 

 

 

 

 

 

 

 

Output Data

O

E

O E

O E O E O E

O

E

O E

O E

O E O E

DXP, DXM

 

 

 

 

 

 

 

 

 

 

 

 

E – Even Bits D0,D2,D4,D6,D8,D10

 

N–9

N–8

N–7

N–6

N–5

 

N–1

N

N+1

N+2

O – Odd Bits D1,D3,D5,D7,D9,D11

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tPDI

CLKOUT

 

 

 

 

 

 

 

 

 

Parallel

 

 

 

 

 

 

 

tsu

 

 

 

9 Clock Cycles

 

 

 

 

th

CMOS

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output Data

N–9

N–8

N–7

N–6

N–5

N–1

N

N+1

N+2

D0–D11

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 1. Latency

 

 

 

 

 

 

 

 

 

 

 

 

 

Input

CLKM

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CLKM

 

 

 

 

 

 

 

 

 

 

Clock

CLKP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Clock

CLKP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output

CLKOUTM

 

 

 

 

 

 

tPDI

 

 

 

 

 

 

 

 

 

 

 

 

 

tPDI

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Clock

CLKOUTP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output

CLKOUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Clock

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

th

 

 

 

 

 

 

 

 

 

 

 

 

tsu

 

 

 

 

 

 

 

 

 

 

 

 

th

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

tsu

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

th

 

 

 

 

 

 

tsu

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output

Dn_Dn+1_P,

 

Dn(1)

 

 

 

 

 

Dn+1(2)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Pair

Dn_Dn+1_M

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Output

Dn

 

 

 

 

 

Dn(1)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data

 

 

 

 

 

 

 

 

 

 

 

 

 

(1)Dn – Bits D0, D2, D4, D6, D8, D10

 

(2)Dn+1 – Bits D1, D3, D5, D7, D9, D11

(1)Dn – Bits D0–D11

Figure 2. LVDS Mode Timing

Figure 3. CMOS Mode Timing

Copyright © 2007–2008, Texas Instruments Incorporated

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